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5. Contributors

Author

Aizawa, Yoshitaka, primary, Allwardt, Jeffrey R., additional, Ando, R., additional, Angel, Ross J., additional, Bozhilov, Krassimir N., additional, Burruss, Robert C., additional, Chen, Jiuhua, additional, Chou, I-Ming, additional, Cody, George D., additional, Crichton, Wilson A., additional, Crowhurst, Jonathan C., additional, Daemen, Luke. L., additional, Dobrzhinetskaya, Larissa F., additional, Dubrovinskaia, Natalia, additional, Dubrovinsky, Leonid, additional, Durham, William, additional, Fei, Yingwei, additional, Frost, Daniel J., additional, Funakoshi, Ken-ichi, additional, Gilder, Stuart A., additional, Goncharov, Alexander F., additional, Green, Harry W., additional, He, Duanwei, additional, Hemley, Russell J., additional, Ito, Eiji, additional, Jackson, Ian, additional, Jacobsen, Steven D., additional, Kaneko, Hiroshi, additional, Kantor, Anastasia, additional, Kantor, Innokenty, additional, Karato, Shun-ichiro, additional, Katayama, Y., additional, Katsura, Tomoo, additional, Kawabe, Kazuyuki, additional, Kubo, Atsushi, additional, Kung, Jennifer, additional, Kuznetsov, Alexei, additional, Lathe, Christian, additional, Lauterjung, Joern, additional, LeGoff, Maxime, additional, Li, Baosheng, additional, Li, Li, additional, Lin, Jung-Fu, additional, Lokshin, Konstantin A., additional, Lu, Wanjun, additional, Mao, Ho-kwang, additional, Mezouar, Mohamed, additional, Mueller, Hans J., additional, Mysen, Bjorn O., additional, Nishihara, Yu, additional, Nishiyama, Norimasa, additional, Nozawa, Akifumi, additional, Ohtani, E., additional, Okuchi, Takuo, additional, Pantea, Cristian, additional, Qian, Jiang, additional, Reichmann, Hans J., additional, Renfro, Alex P., additional, Rivers, Mark L., additional, Santoro, Mario, additional, Schilling, Frank R., additional, Schmidt, Burkhard C., additional, Shen, Guoyin, additional, Spetzler, Hartmut A., additional, Stebbins, Jonathan F., additional, Struzhkin, Viktor V., additional, Sturhahn, Wolfgang, additional, Lee, Sung Keun, additional, Sutton, Steve R., additional, Suzuki, A., additional, Uchida, Takeyuki, additional, Urakawa, S., additional, Vaughan, Michael T., additional, Von Dreele, Robert, additional, Wang, Liping, additional, Wang, Yanbin, additional, Weidner, Donald J., additional, Xu, Yousheng, additional, Yokoshi, Sho, additional, Young, Christopher E., additional, Zaug, Joseph M., additional, Zhang, Jianzhong, additional, Zhao, Jiyong, additional, and Zhao, Yusheng, additional

Published
2005
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10. Chapter 7: Stress and strain measurements of polycrystalline materials under controlled deformation at high pressure using monochromatic synchrotron radiation.

Author

Uchida, Takeyuki, Yanbin Wang, Rivers, Mark L., and Sutton, Steve R.

Abstract

We describe techniques for stress and strain measurements using monochromatic diffraction and imaging instruments developed at the GSECARS beamline of the Advanced Photon Source for controlled quantitative deformation experiments at high pressures and high temperatures. Details about the experimental procedure, including sample and cell preparation, system operation, and data analysis are discussed. Based on these techniques, examples of data obtained for a powdered MgO sample are presented, demonstrating the capability of decoupling differential stress from pressure by advancing and retracting the differential rams while adjusting the main hydraulic ram, so that both positive (σ1 > σ2 = σ3) and negative (σ1 < σ2 = σ3) differential stress conditions can be achieved and controlled under a given pressure. This technical capability enables us to examine sample properties within either the elastic or the plastic regimes. Differential lattice strains computed from distortion of diffraction Debye rings recorded on a 2D charge coupled device X-ray detector, can be used as a "stress gauge" with a resolution between 10-5 and 10-4, a result of the complete 360° azimuth angle coverage. The errors in total axial strain, obtained from the sample length measurements in the vertical direction, are between 10-4 and 10-3. Differential stresses, computed from the differential lattice strains for reflections hkl, are in general non-equivalent. Differential stress versus total strain curves provide information on hysteresis loops and the yield point. Beyond the yield point, the flow stress of MgO increases with total axial strain, with significant work hardening. This behavior is consistent with previous stress-strain measurements using a gasmedium apparatus, demonstrating the capability of quantitative deformation experiments under high pressure. Further developments are needed to better understand the correlations between X-ray stress measurements, texture observation, and flow mechanism. [ABSTRACT FROM AUTHOR]

Published
2005
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