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Your search keyword '"Pizarro, J."' showing total 15 results
Start Over Author "Pizarro, J." Publication Type Books
15 results on '"Pizarro, J."'

2. Reconceiving the Biological Invasion of North American Beavers (Castor canadensis) in Southern Patagonia as a Socio-ecological Problem: Implications and Opportunities for Research and Management

Author

Anderson, Christopher B., primary, Pizarro, J. Cristóbal, additional, Valenzuela, Alejandro E. J., additional, Ader, Natalia, additional, Ballari, Sebastián, additional, Cabalín, José Luis Cabello, additional, Car, Valeria, additional, Dicenta, Mara, additional, Nielsen, Erik A., additional, Roulier, Catherine, additional, and Van Aert, Peter, additional

Published
2021
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3. Listening to Elders

Author

Ibarra, José Tomás, primary, Barreau, Antonia, additional, Caviedes, Julián, additional, Pessa, Natalia, additional, Valenzuela, Jeannette, additional, Navarro-Manquilef, Sylvia, additional, Monterrubio-Solís, Constanza, additional, Ried, Andrés, additional, and Cristóbal Pizarro, J., additional

Published
2020
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14. Quantification of the influence of TEM operation parameters on the error of HREM image matching.

Author

Cullis, A. G., Hutchison, J. L., Pizarro, J., Guerrero, E., Galindo, P., Yañez, A., Ben, T., and Molina, S. I.

Abstract

In this paper we describe a pattern recognition system implemented to determine thickness and defocus from HRTEM simulated images. A specific task has been designed to quantify the influence of certain operation parameters of a transmission electron microscope in the global recognition error rate. This influence allows us to estimate human recognition confidence when applying pattern matching to the determination of thickness and defocus from HRTEM maps. The images considered in this task correspond to InP with the sphalerite crystalline structure and were simulated using the EMS computer software package. [ABSTRACT FROM AUTHOR]

Published
2005
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15. Strain mapping from HRTEM images.

Author

Cullis, A. G., Hutchison, J. L., Galindo, P. L., Yáñez, A., Pizarro, J., Guerrero, E., Ben, T., and Molina, S. I.

Abstract

Strain mapping is defined as a numerical image processing technique that measures the local shifts of image details around a crystal defect with respect to the ideal, defect-free, positions in the bulk. The most common algorithms for strain mapping are based on peak finding (real space) and geometric phase (Fourier space) methods. In this paper, we discuss both algorithms and propose an alternative algorithm (Peak Pairs) based on the detection of pairs of intensity maxima in the affine transformed space which exhibits good behavior at dislocations. Quantitative results are reported from experiments to determine local stresses in different types of quantum heterostructures. [ABSTRACT FROM AUTHOR]

Published
2005
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