6 results on '"Maul, J."'
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2. Advances in Ion Probes A-DIDA
3. The IONMICROPROBE A-DIDA 3000-30 for Dopant Depth Profiling and Impurity Bulk Analysis
4. Quantitative Investigation of As Segregation at the SiO2/Si Interface by SIMS and RBS
5. How to Make the Most of the SIMS Method by Means of the Scanning Ion Microscope A-DIDA
6. Energy Dependence and Annealing Behaviour of Boron Range Distributions in Silicon
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