34 results on '"Yamaguchi, Tomuo"'
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2. Surface etching effects of amorphous C:H and CN x:H films formed by supermagnetron plasma for field emission use
3. Optics of anisotropic nanostructures
4. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate
5. Magneto-optic ellipsometry in exchange-coupled films
6. Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures
7. A high-sensitivity particle monitor using an integration sphere
8. Optical properties of rough LaNiO 3 thin films studied by spectroscopic ellipsometry and reflectometry
9. Optical properties of NiO thin films prepared by pulsed laser deposition technique
10. Optical characterization of sol–gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
11. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO 2 films
12. Magnetic sensor with prism coupler
13. High purity InxGa1−xSb single crystals with cutoff wavelength of 7–8 µm grown by melt epitaxy
14. Improved purity of long-wavelength InAsSb epilayers grown by melt epitaxy in fused silica boats
15. Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials.
16. Gravitational Effects on Mixing and Growth Morphology of an In.
17. Dependence of Energy Band Gap and Lattice Constant of III-V Semiconductors on Electronegativity Difference of the Constituent Elements.
18. Resonant optical absorption by discontinuous transparent overlayers on gold surfaces.
19. Evidence of native oxides on the capping and substrate of Permalloy gratings by magneto-optical spectroscopy in the zeroth- and first-diffraction orders.
20. High purity InxGa1−xSb single crystals with cutoff wavelength of 7–8 µm grown by melt epitaxy.
21. Spectroscopic ellipsometric characterization of diamondlike carbon films.
22. Structural properties of carbon films deposited by pulsed ArF laser ablation: effects of substrate temperature, bias and H 2 pressure
23. Optical properties of granular copper systems
24. Optical anisotropy in well-defined cermets by spectroscopic ellipsometry
25. Properties of a-Si:H based interface transient layers measured by in-situ ellipsometry
26. Determination of optical properties of amorphous and crystalline thin films by spectroellipsometry
27. Structural properties of poly-Si deposited by rf glow discharge using 100% SiH 4
28. Properties of heavily phosphorous-doped μc-Si deposited by mesh attached cathode-type r.f. glow discharge
29. Spectroellipsometric characterization of thin silicon nitride films
30. Spectroellipsometric characterization of SIMOX with nanometre-thick top Si layers
31. Influence of thickness distribution on spectroscopic ellipsometry of SOS
32. Optoelectronic properties of as-deposited and annealed P-doped microcrystalline Si films deposited by rf glow discharge.
33. Evaluation of the quality of Permalloy gratings by diffracted magneto-optical spectroscopy.
34. Thickness monitoring of optical filters for DWDM applications.
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