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Your search keyword '"Triloki, Triloki"' showing total 4 results
Start Over Author "Triloki, Triloki" Publication Type Academic Journals
4 results on '"Triloki, Triloki"'

1. Time performance of Analog Pixel Test Structures with in-chip operational amplifier implemented in 65 nm CMOS imaging process

Author

Rinella, Gianluca Aglieri, Aglietta, Luca, Antonelli, Matias, Barile, Francesco, Benotto, Franco, Beolè, Stefania Maria, Botta, Elena, Bruno, Giuseppe Eugenio, Carnesecchi, Francesca, Colella, Domenico, Colelli, Angelo, Contin, Giacomo, Robertis, Giuseppe De, Dumitrache, Floarea, Elia, Domenico, Ferrero, Chiara, Fransen, Martin, Kluge, Alex, Kumar, Shyam, Lemoine, Corentin, Licciulli, Francesco, Lim, Bong-Hwi, Loddo, Flavio, Mager, Magnus, Marras, Davide, Martinengo, Paolo, Pastore, Cosimo, Patra, Rajendra Nath, Perciballi, Stefania, Piro, Francesco, Prino, Francesco, Ramello, Luciano, Ramos, Arianna Grisel Torres, Reidt, Felix, Russo, Roberto, Sarritzu, Valerio, Savino, Umberto, Schledewitz, David, Selina, Mariia, Senyukov, Serhiy, Sitta, Mario, Snoeys, Walter, Sonneveld, Jory, Suljic, Miljenko, Triloki, Triloki, and Turcato, Andrea

Published
2025
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2. Characterization of LAPPD timing at CERN PS testbeam

Author

Bhattacharya, Deb Sankar, Bressan, Andrea, Chatterjee, Chandradoy, Torre, Silvia Dalla, Gregori, Mauro, Kiselev, Alexander, Levorato, Stefano, Martin, Anna, Minutoli, Saverio, Osipenko, Mikhail, Rai, Richa, Ripani, Marco, Tessarotto, Fulvio, and Triloki, Triloki

Published
2024
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3. Characterization of Monolithic Active Pixel Sensors for future collider experiments

Author

Colelli Angelo, Barile Francesco, Bruno Giuseppe Eugenio, Di Bari Domenico, Franco Antonio, Kumar Shyam, Pastore Cosimo, Nath Patra Rajendra, and Triloki Triloki

Subjects
Physics, QC1-999
Abstract

In high-energy physics experiments, Monolithic Active Pixel Sensors (MAPS) have become crucial components of vertex and tracking detectors over the past decade due to the integration of readout circuitry with the detection volume in a single chip. The requirement to achieve precise tracking and vertexing capabilities for upgrade of HEP experiments, such as ALICE at LHC and ePIC at EIC, has implied a strong R&D towards an ultra-thin (a few tens of μm), bent, wafer-scale silicon sensors produced with stitching technology. Recent ongoing activities on CMOS silicon sensor testing performed at the INFN Laboratory in Bari will be described. The characterization of analogue silicon pixel sensors of 65 nm CMOS technology using electrical test pulsing and 55Fe as a soft X-ray source will be discussed. Furthermore, a study on timing performance will be presented.

Published
2024
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