1. Charge collection studies of SOI diodes
- Author
-
Colladant, T., Ferlet-Cavrois, V., Musseau, O., L'Hoir, A., Campbell, A.B., Buchner, S., Knudson, A., McMorrow, D., Fischer, B., Schlogl, M., and Lewis, D.
- Subjects
Silicon-on-isolator -- Testing ,Diodes -- Testing ,Business ,Electronics ,Electronics and electrical industries - Abstract
Charge collection measurements on SOI diodes have been performed with heavy ion microbeam and pulsed focused laser. Both irradiation techniques show that no electrical coupling occurs. However, laser measurements show an optical coupling effect when irradiation occurs close to the isolation trench. Qualitative electromagnetic simulations have been performed to confirm and describe the optical coupling. Index Terms--Charge collection, heavy ion, pulsed laser, SOI.
- Published
- 2002