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216 results on '"Ribes, G"'

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4. Competitive and cost effective copper/low-k interconnect (BEOL) for 28 nm CMOS technologies

14. Cholera in Madagascar

21. Eighth annual meeting of the European Association for the Study of Diabetes: Madrid, Spain September, 6–8, 1972

24. SiO2 interfacial layer as the origin of the breakdown of high-k dielectrics stacks.

25. Impact of progressive oxide soft breakdown on metal oxide semiconductor parameters: Experiment and modeling.

26. New Insights Into Recovery Characteristics During PMOS NBTI and CHC Degradation.

27. Origin of Vt instabilities in high-k dielectrics Jahn-Teller effect or oxygen vacancies.

28. Multi-vibrational hydrogen release: Physical origin of T bd,Q bd power-law voltage dependence of oxide breakdown in ultra-thin gate oxides

29. Review on high-k dielectrics reliability issues.

30. Interface trap generation and hole trapping under NBTI and PBTI in advanced CMOS technology with a 2-nm gate oxide.

39. 4-Hydroxyisoleucine: a novel amino acid potentiator of insulin secretion.

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