14 results on '"Denais, M."'
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2. Designing in reliability in advanced CMOS technologies
3. NBTI degradation: From physical mechanisms to modelling
4. Multi-vibrational hydrogen release: Physical origin of Tbd, Qbd power-law voltage dependence of oxide breakdown in ultra-thin gate oxides
5. Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs
6. Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown
7. A thorough investigation of MOSFETs NBTI degradation
8. Breakdown mechanisms in ultra-thin oxides: impact of carrier energy and current through substrate hot carrier stress study
9. New Insights Into Recovery Characteristics During PMOS NBTI and CHC Degradation.
10. Origin of Vt instabilities in high-k dielectrics Jahn-Teller effect or oxygen vacancies.
11. Review on high-k dielectrics reliability issues.
12. Interface trap generation and hole trapping under NBTI and PBTI in advanced CMOS technology with a 2-nm gate oxide.
13. Multi-vibrational hydrogen release: Physical origin of T bd,Q bd power-law voltage dependence of oxide breakdown in ultra-thin gate oxides
14. Automated speech analysis for risk detection of depression, anxiety, insomnia, and fatigue: Algorithm Development and Validation Study.
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