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In this review we discuss the advances in use of GaN and ZnO-based solid-statesensors for gas sensing applications. AlGaN/GaN high electron mobility transistors(HEMTs) show a strong dependence of source/drain current on the piezoelectricpolarization -induced two dimensional electron gas (2DEG). Furthermore, spontaneous andpiezoelectric polarization induced surface and interface charges can be used to develop verysensitive but robust sensors for the detection of gases. Pt-gated GaN Schottky diodes and Sc2O3/AlGaN/GaN metal-oxide semiconductor diodes also show large change in forwardcurrents upon exposure to H2 containing ambients. Of particular interest are methods fordetecting ethylene (C2H4), which offers problems because of its strong double bonds andhence the difficulty in dissociating it at modest temperatures. ZnO nanorods offer largesurface area, are bio-safe and offer excellent gas sensing characteristics.

The valence band offset at both SiO2/β-Ga2O3 and HfSiO4/β-Ga2O3 heterointerfaces was measured using X-ray photoelectron spectroscopy. Both dielectrics were deposited by atomic layer deposition (ALD) onto single-crystal β-Ga2O3. The bandgaps of the materials were determined by reflection electron energy loss spectroscopy as 4.6 eV for Ga2O3, 8.7 eV for Al2O3 and 7.0 eV for HfSiO4. The valence band offset was determined to be 1.23 ± 0.20 eV (straddling gap, type I alignment) for ALD SiO2 on β-Ga2O3 and 0.02 ± 0.003 eV (also type I alignment) for HfSiO4. The respective conduction band offsets were 2.87 ± 0.70 eV for ALD SiO2 and 2.38 ± 0.50 eV for HfSiO4, respectively. [ABSTRACT FROM AUTHOR]