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New instruments to characterize vegetation must meet cost constraints while providing accurate information. In this paper, we study the potential of a laser speckle system as a low-cost solution for non-destructive phenotyping. The objective is to assess an original approach combining laser speckle with chemometrics to describe scattering and absorption properties of sunflower leaves, related to their chemical composition or internal structure. A laser diode system at two wavelengths 660 nm and 785 nm combined with polarization has been set up to differentiate four sunflower genotypes. REP-ASCA was used as a method to analyze parameters extracted from speckle patterns by reducing sources of measurement error. First findings have shown that measurement errors are mostly due to unwilling residual specular reflections. Moreover, results outlined that the genotype significantly impacts measurements. The variables involved in genotype dissociation are mainly related to scattering properties within the leaf. Moreover, an example of genotype classification using REP-ASCA outcomes is given and classify genotypes with an average error of about 20%. These encouraging results indicate that a laser speckle system is a promising tool to compare sunflower genotypes. Furthermore, an autonomous low-cost sensor based on this approach could be used directly in the field. [ABSTRACT FROM AUTHOR]

We apply reverse engineering techniques (RET) to analyze the dehydration process of a sunflower leaf with terahertz time-domain spectroscopy. The multilayer structure of the leaf is extracted with accuracy during the entire process. Time variations of thickness and the complex index are emphasized for all leaf layers (2 cuticules, 2 epiderms, and 2 mesophylls). The global thickness of the sunflower leaf is reduced by up to 40% of its initial value.

We analyze the multilayer structure of sunflower leaves from Terahertz data measured in the time-domain at a ps scale. Thin film reverse engineering techniques are applied to the Fourier amplitude of the reflected and transmitted signals in the frequency range f < 1.5 Terahertz (THz). Validation is first performed with success on etalon samples. The optimal structure of the leaf is found to be a 8-layer stack, in good agreement with microscopy investigations. Results may open the door to a complementary classification of leaves.

This study aims to investigate the combination of speckle pattern analysis, polarization parameters, and chemometric tools to predict the optical absorption and scattering properties of materials. For this purpose, an optical setup based on light polarization and speckle measurements was developed, and turbid samples were measured at 405 and 660 nm. First, a backscattered polarized speckle acquisition was performed on a set of 41 samples with various scattering (${\mu}&#95;s$μ s ) and absorbing (${{\mu}&#95;a}$μ a ) coefficients. Then, several parameters were computed from the polarized speckle images, and prediction models were built using stepwise multiple linear regression. For scattering media, ${{\mu}&#95;s}$μ s was predicted with ${R^{2} = 0.9}$R 2 =0.9 using two parameters. In the case of scattering and absorbing media, prediction results using two parameters were ${R^{2} = 0.62}$R 2 =0.62 for ${{\mu}&#95;s}$μ s and ${R^{2} = 0.8}$R 2 =0.8 for ${{\mu}&#95;a}$μ a . The overall results obtained in this research showed that the combination of speckle pattern analysis, polarization parameters, and chemometric tools to predict the optical bulk properties of materials show interesting promise.