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Abstract: We discuss the wavelet transform profilometry based on the continuous wavelet transform technique as viewed from frequency analysis. We deduce the expression of one-dimensional (1-D) and two-dimensional (2-D) wavelet transform in frequency domain and analyze their characteristics in the application of demodulating the fringe patterns. We also compare 1-D CWT and 2-D CWT in demodulating the oblique fringe patterns with dual carrier frequency components. When oblique fringe patterns are processed, the direction normal to the grating line and x axis or y axis is not identical. By 1-D CWT, in which wavelet transform is carried out row by row, we cannot obtain the most similarity between local signal and the wavelet functions with different dilation values. While a fan 2-D continuous wavelet transformation can deal with the fringe pattern as a 2-D unit as well as has multi-directions, its advantage is that it can be used to exact the information in the spatial direction. However, its spatial localization ability is not very good, which leads that it is not suitable for demodulating the fringe patterns with high phase variation. Computer simulations and experiments have verified our analysis. [Copyright &y& Elsevier]

Abstract: A Hilbert assisted wavelet transform (HWT) method is presented for phase reconstruction of 3D profilometry and interferometry. A rigorous mathematical demonstration about this HWT method is given in this paper. An important conclusion that the phase of the optical fringe pattern is equal to the phase of its HWT coefficients on the ridge is theoretically clarified. The strict relation between the scale parameter and the phase gradient (also called the angular frequency) of the fringe pattern is also given. Computer simulations and experiments reveal the validity of the method and the correctness of the mathematical demonstration. Since the filtering process is avoided in this method, it can deal with the frequency overlapping problem to a certain extent. Applications of this method in both optical profilometry and interferometry are shown and discussed in the experiment section. [Copyright &y& Elsevier]