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In network on chips (NoCs) design, reconfiguration of NoC is a very effective option for minimizing power consumption, and Gaussian networks can provide significant advantage over the mesh networks in terms of network diameter, average hop distance and so on. In this paper, based on the special topology structure and the static connection rules within Gaussian networks, we present the reconfiguration representation for Gaussian networks and the nature of reconfigurable Gaussian networks. Furthermore, reconfigurable rules of Gaussian networks are proposed to design the constraints for automatic reconfiguration of NoC. [ABSTRACT FROM PUBLISHER]

Scratchpad memories in GPU architectures are employed as software-controlled caches to increase the effective GPU memory bandwidth. Through the use of well-known optimization techniques, such as privatization and tiling, they are properly exploited. Typically, they are banked memories which are addressed with a \textmod(2^N) bank indexing scheme. Although their bandwidth is fully exploited for linear memory accesses, their performance is burdened when non-unit strides appear in memory access patterns because they provoke bank conflicts. This paper explores the use of configurable bit-vector and bitwise XOR-based hash functions to evenly distribute memory addresses of the access patterns over the memory banks, reducing the number of bank conflicts. An exhaustive, but lightweight, search is used to configure bit-vector hash functions. Bitwise hash functions are configured with heuristics. Hardware and software implementations are carried out. For the hardware approach, the experimental results show 24 percent performance speed-up for 22 benchmarks on GPGPU-Sim, a Fermi-like simulator. Bank conflicts are reduced by 96 percent with bit-vector hash functions, and 97 percent with bitwise hash functions using our proposed Minimum Imbalance Heuristic. The software approach, using bit-vector hash functions, demonstrates 23 percent speed-up and 96 percent bank conflict reduction on a Fermi GPU, and 33 percent speed-up and 99 percent bank conflict reduction on a Kepler GPU. [ABSTRACT FROM AUTHOR]

As a result of huge advancements in VLSI technology, more and more complex circuits are being implemented making not only the whole digital system more prone to faults, but also the fault detector itself susceptible to faults resulting in the requirement of concurrent fault detection architecture of the encoders and decoders. In this paper, we present a multiple-bit parity-based fault detection architecture for parallel CRC computation. After analyzing the parallel implementation of CRC, we present a formulation to generate a multiple-bit parity prediction structure to incorporate the fault detection architecture. Using the formulations of digit level CRC architecture, the checksum is divided into few blocks and predicted multiple-bit parity of the blocks are compared with the actual parity bits. Finally, with the help of software simulation and ASIC implementation, we show that the proposed scheme is highly efficient in terms of fault detection capability whereas it involves small area and time overhead. As an example, we have shown that the worst case area overhead is $25.7$ percent for CRC $-32$ with four parity bits, and corresponding time overhead is $15.6$ percent. [ABSTRACT FROM PUBLISHER]

Due to their high density, modern DRAMs are very susceptible to the interactions between adjacent cells, which in turn increases the difficulty and complexity of memory testing. In this work, we studied the interaction mechanisms among neighbouring DRAM cells in order to provide an efficient testing solution. According to the open literature, there are two mechanisms responsible for this interaction: leakage currents and cell state transitions. The frequently used Coupling Fault (CF) model is inadequate to model the combined effect of these mechanisms, while testing procedures using the Neighborhood Pattern Sensitive Fault (NPSF) model are not time efficient solutions. Towards this direction, we propose a new fault model, the Neighborhood Leakage and Transition Fault (NLTF) model for DRAMs, which effectively models the faulty behavior related to neighbouring cell interference. In addition, we developed a new test algorithm which is based on the NLTF model, and provides test application time reductions ranging from 68 to 87 percent with respect to the existing testing algorithms in the literature that are capable to cover the NLTFs. Finally, the proposed algorithm is extended to cover NLTFs in word-oriented DRAMs. [ABSTRACT FROM AUTHOR]