1. AC conductivity and scaling studies of polycrystalline SnF2
- Author
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L. N. Patro and K. Hariharan
- Subjects
Permittivity ,Materials science ,Master curves ,Analytical chemistry ,Dielectric ,Conductivity ,Ac conductivities ,Dc conductivities ,Atmospheric temperature ,Temperature dependents ,Electric conductivity ,Scaling behaviors ,Electrical resistivity and conductivity ,Electrical conductivity ,Activation energy ,General Materials Science ,Ceramic capacitors ,Relaxation mechanisms ,Scaling ,Real parts ,Condensed matter physics ,Impedance spectroscopies ,Condensed Matter Physics ,Thermal conduction ,Room temperatures ,Modulus datum ,Dielectric spectroscopy ,Phase transition temperatures ,Temperature-dependent conductivities ,Frequency dependents ,Phase transitions ,Scaling parameters ,Transport properties ,Electrical properties ,Poly-crystalline ,Relaxation (physics) ,Scaling studies ,Conductivity relaxations - Abstract
The conduction characteristics of SnF2 from room temperature (300 K) to 463 K have been investigated by using impedance spectroscopy. The temperature dependent conductivity plot shows a break in conductivity around 443 K corresponding to the ? ? ? phase transition temperature. The electrical properties of SnF2 are also investigated by extracting dielectric and modulus data from impedance values. The frequency dependent plots of M? and Z? show that the conductivity relaxation is non-Debye in nature. The activation energy responsible for relaxation has been calculated from the modulus spectra and is found to be almost the same as that from the temperature dependent dc conductivity data. The real part of conductivity and permittivity in addition to the modulus spectra of the present system show scaling behavior, which means ??(?), ??(?) and M?(?) isotherms successfully collapse to a single master curve indicating that the relaxation mechanism is temperature independent. Different scaling approaches have been applied to arrive at a correlation between the scaling parameters. � 2009 Elsevier B.V. All rights reserved.
- Published
- 2009
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