1. The Electric Field Dependence of Single Electron Emission in the PIXeY Two-Phase Xenon Detector
- Author
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Bodnia, E., Bernard, E. P., Biekert, A., Boulton, E. M., Cahn, S. B., Destefano, N., Edwards, B. N. V., Gai, M., Horn, M., Larsen, N. A., Riffard, Q., Tennyson, B., Velan, V., Wahl, C., and McKinsey, D. N.
- Subjects
Physics - Instrumentation and Detectors ,Physics::Instrumentation and Detectors ,Noble liquid detectors ,FOS: Physical sciences ,02 engineering and technology ,Applied Physics (physics.app-ph) ,Detector modelling and simulations II ,01 natural sciences ,High Energy Physics - Experiment ,High Energy Physics - Experiment (hep-ex) ,Engineering ,0103 physical sciences ,Dark Matter detectors ,010306 general physics ,Instrumentation ,physics.ins-det ,Mathematical Physics ,hep-ex ,Physics - Applied Physics ,Instrumentation and Detectors (physics.ins-det) ,021001 nanoscience & nanotechnology ,Nuclear & Particles Physics ,Physical Sciences ,0210 nano-technology ,physics.app-ph ,Photoemission - Abstract
Dual phase xenon detectors are widely used in experimental searches for galactic darkmatter particles. The origin of single electron backgrounds following prompt scintillation and proportional scintillation signals in these detectors is not fully understood, although there has been progress in recent years. In this paper, we describe single electron backgrounds in ${}^{83m}Kr$ calibration events and their correlation with drift and extraction fields, using the Particle Identification in Xenon at Yale (PIXeY) dual-phase xenon time projection chamber. The single electron background induced by the Fowler-Nordheim (FN) effect is measured, and its electric field dependence is quantified. The photoionization of grids and impurities by prompt scintillation and proportional scintillation also contributes to the single electron background., Comment: accepted for publication in JINST
- Published
- 2021