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A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.

In this paper, a practical implementation of a recently proposed automatic and sequential sampling algorithm for the near-field scanning of printed circuit boards and/or integrated circuits is presented. The sampling algorithm minimizes the required number of sampling points by making a balanced trade-off between ‘exploration’ and ‘exploitation’. Moreover, at every moment analytical models for the complete near-field pattern can be computed by means of Kriging. By comparing successive models, an automatic stopping criterion can be implemented. The performance and effectiveness of the proposed sampling algorithm is tested on a number of simple printed circuit boards and compared with that of the traditionally used uniform sampling. ispartof: pages:1-5 ispartof: Proceedings of EMC Europe 2012, Rome pages:1-5 ispartof: EMC Europe 2012 location:Rome date:17 Sep - 21 Sep 2012 status: published

© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works Recently, near-field scanning techniques for measuring and analysing stochastic emissions have been theoretically and experimentally studied and they are promising in terms of the characterization and classification radiated emissions in densely integrated technologies. Nonetheless, one of their drawbacks is the volume of data generated by time-domain acquisitions made across the scanning grid. Moreover, there are a multiplicity of sources of systematic errors that can pass unnoticed in measurements and that could compromise the accuracy of the data used for post-processing. This paper presents a pre-evaluation procedure that follows an exploratory data analysis approach for detecting such errors using an objective statistical criterion when applied to stochastic emissions of near-field scanning measurement data. Results are presented using real measurement data from the scanning of an Arduino Intel Galileo board, as has been reported in previous studies. By performing the proposed analysis, significant errors were detected in the measurement data. Final remarks on the importance of performing quality clearance in the measurement data from stochastic emissions assessments are provided. © 2018 IEEE.

This paper gives an overview of the recent developments in using near-field scanning for proactive EMC work. The aim is to use measured near fields as a source for simulations in order to predict radiated emission from printed circuit boards placed in a product. Far fields were predicted based on only H-fields on the top and bottom surface on a Huygens’ box surrounding the board. Simulation of a simple board with microstrips and measurements of a complicated signal board were used to evaluate the proposed method.