6 results on '"Rooyackers, R."'
Search Results
2. Impact of elevated source drain architecture on ESD protection devices for a 90nm CMOS technology node
3. Design methodology of FinFET devices that meet IC-Level HBM ESD targets
4. NMOS and PMOS triple gate devices with mid-gap metal gate on oxynitride and Hf based gate dielectrics
5. 90nm RF CMOS technology for low-power 900MHz applications
6. Electrical and thermal scaling trends for SOI Fin FET ESD design
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.