1. Determination of the refractive index and wavelength‐dependent optical properties of few‐layer CrCl within the Fresnel formalism
- Author
-
Roberto Gunnella, Shafaq Kazim, Tomasz Klimczuk, Marco Zannotti, Rita Giovannetti, and Luca Ottaviano
- Subjects
0303 health sciences ,Histology ,Materials science ,business.industry ,media_common.quotation_subject ,02 engineering and technology ,Fresnel equations ,021001 nanoscience & nanotechnology ,Exfoliation joint ,Pathology and Forensic Medicine ,law.invention ,Absorbance ,03 medical and health sciences ,Wavelength ,Optics ,Optical microscope ,law ,Contrast (vision) ,0210 nano-technology ,business ,Refractive index ,Layer (electronics) ,030304 developmental biology ,media_common - Abstract
Based on previous reports on the optical microscopy contrast of mechanically exfoliated few layer CrCl 3 transferred on 285 nm and 270 nm SiO 2 on Si(100), we focus on the experimental determination of an effective mean complex refractive index via a fitting analysis based on the Fresnel equations formalism. Accordingly, the layer and wavelength-dependent absorbance and reflectance are calculated. Layer and wavelength-dependent optical contrast curves are then evaluated demonstrating that the contrast is significantly high only around well-defined wavelength bands. This is validated a posteriori, by experimental UV-Vis absorbance data. The present study aims to show the way towards the most reliable determination of thickness of the 2D material flakes during exfoliation.
- Published
- 2021