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8 results on '"Reliable RF and Mixed-signal Systems (RMS )"'

1. mm-Wave Through-Load Element for On-Wafer Measurement Applications

Author

Sylvie Lepilliet, Philippe Ferrari, Loic Vincent, Christophe Gaquiere, Olivier Occello, Emmanuel Pistono, Abdelhalim A. Saadi, Marc Margalef-Rovira, Vanessa Avramovic, Manuel J. Barragan, Sylvain Bourdel, Puissance - IEMN (PUISSANCE - IEMN), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Laboratoire de Radio-Fréquence et d'Intégration de Circuits (RFIC-Lab ), Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Université Grenoble Alpes (UGA), NXP Semiconductors [France], Plateforme de Caractérisation Multi-Physiques - IEMN (PCMP - IEMN), Centre Interuniversitaire de Micro-Electronique (CIME), Institut National Polytechnique de Grenoble (INPG), Reliable RF and Mixed-signal Systems (TIMA-RMS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), PCMP CHOP, European Project: 737454,H2020,H2020-ECSEL-2016-1-RIA-two-stage,TARANTO(2017), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), and Reliable RF and Mixed-signal Systems (RMS )

Subjects
Through-load, transfer-switch millimeter-wave, attenuator, 02 engineering and technology, BiCMOS, law.invention, law, 0202 electrical engineering, electronic engineering, information engineering, Insertion loss, slow-wave, Electrical and Electronic Engineering, Physics, Attenuator (electronics), on-wafer, business.industry, 020208 electrical & electronic engineering, Bandwidth (signal processing), Transistor, Electrical engineering, Transfer switch, 3-dB coupler, [SPI.TRON]Engineering Sciences [physics]/Electronics, Return loss, business, Voltage
Abstract

This paper presents an innovative Through-Load element aimed at characterization applications at mm-wave frequencies. The proposed structure can behave as a Through connection or as a 50- $\Omega $ load depending on a DC control voltage. Among other potential applications, this system can be used to implement a transfer switch or an attenuator. A demonstrator was fabricated and measured in the STM 55-nm BiCMOS technology. Over a wide bandwidth, from 55 GHz up to 170 GHz, experimental measurements demonstrate a maximum 1.6-dB of insertion loss when behaving as a Through connection and a minimum 14-dB of insertion loss when behaving as a 50- $\Omega $ load. In both cases, the return loss is better than 10 dB. The insertion loss at 90 GHz is 0.6 dB for the Through connection and 20 dB for the 50- $\Omega $ load connection.

Published
2021

2. Towards a Digital Twin model for Building Energy Management: Case of Morocco

Author

Abdelali Agouzoul, Mohamed Tabaa, Badr Chegari, Karim Alami, Abbas Dandache, Emmanuel Simeu, Laboratoire Pluridisciplinaire de Recherche et Innovation (LPRI), Ecole Marocaine des Sciences de l'Ingénieur (EMSI), Reliable RF and Mixed-signal Systems (RMS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Laboratoire de Génie Informatique, de Production et de Maintenance (LGIPM), and Université de Lorraine (UL)

Subjects
IoT, Architectural engineering, energy management, smart cities, Computer science, [INFO.INFO-OH]Computer Science [cs]/Other [cs.OH], 02 engineering and technology, Standard of living, 7. Clean energy, Globalization, digital twin, Urbanization, building, 11. Sustainability, 0202 electrical engineering, electronic engineering, information engineering, Production (economics), General Environmental Science, 020206 networking & telecommunications, Energy consumption, Energy conservation, Identification (information), PACS 8542, Work (electrical), General Earth and Planetary Sciences, 020201 artificial intelligence & image processing, industry of the future
Abstract

International audience; During successive industrial revolutions, the objective has not only been for industry to improve and satisfy its direct needs, it has also been to improve society’s standard of living and make life easier for the consumer. Therefore, economic growth should always go hand in hand with each industrial revolution. The medical industry, energy conservation and, in particular, production technologies will be transformed through new value chain models. Globalization, urbanization, demographic change and energy transformation are the transforming forces estimating the technological impetus for a better identification of solutions for a world on the move. In recent years, successive revolutions have made remarkable contributions to a person’s quality of life, safety, industrial economy, comfort and health. This work aims at improving the energy consumption of buildings. To achieve this goal, we have created a Digital Twin that accurately reflects the behavior and characteristics of a future or existing building. To reproduce a copy of the future or existing building, we chose to use the Autodesk REVIT solution to meet several constraints. These have a significant influence on the energy behavior of the building.

Published
2021

3. A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated Circuits

Author

Estelle Lauga-Larroze, Florent Cilici, Loic Vincent, Salvador Mir, Manuel J. Barragan, Sylvain Bourdel, Gildas Leger, Reliable RF and Mixed-signal Systems (RMS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Laboratoire de Radio-Fréquence et d'Intégration de Circuits (RFIC-Lab ), Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Université Grenoble Alpes (UGA), Instituto de Microelectrónica de Sevilla (IMSE-CNM), Universidad de Sevilla-Centro Nacional de Microelectronica [Spain] (CNM)-Consejo Superior de Investigaciones Científicas [Madrid] (CSIC), Centre Interuniversitaire de Micro-Electronique (CIME), and Institut National Polytechnique de Grenoble (INPG)

Subjects
BIST, Test strategy, Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Integrated circuit, Machine learning, computer.software_genre, law.invention, law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Leverage (statistics), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, Index Terms-mm-wave IC test, Electronic circuit, machine learning-based test, Radiation, non-intrusive test, business.industry, Design-for- Test, 020206 networking & telecommunications, Test method, Condensed Matter Physics, PACS 8542, CMOS, Built-in self-test, process monitor circuits, Device under test, Artificial intelligence, business, computer
Abstract

International audience; In this article, we leverage the power of machine learning algorithms to propose a test methodology for millimeter-wave (mm-wave) integrated circuits. The proposed test strategy is based on identifying the main process degradation mechanisms in a particular device under test (DUT) and then designing dedicated process monitor circuits to characterize this degradation and infer the DUT performance. The resulting process monitors do not load or couple to any of the DUT nodes, and the methodology can be adapted to any mm-wave device without complex codesign. The proposed test methodology is illustrated on a set of 21 fabricated samples of a 65-GHz PA designed in STMicroelectronics 55-nm CMOS technology.

Published
2020

4. Visual Perceptual Quality Assessment Based on Blind Machine Learning Techniques

Author

Ghislain Takam Tchendjou, Emmanuel Simeu, BEN TITO, Laurence, Reliable RF and Mixed-signal Systems (RMS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), and Université Grenoble Alpes (UGA)

Subjects
Databases, Factual, [INFO.INFO-OH]Computer Science [cs]/Other [cs.OH], Normal Distribution, convolutional neural network, visual perception, TP1-1185, 02 engineering and technology, Biochemistry, Article, Analytical Chemistry, Machine Learning, non-distortion-specific, 0202 electrical engineering, electronic engineering, information engineering, Image Processing, Computer-Assisted, Electrical and Electronic Engineering, Instrumentation, blind image quality assessment, regression technique, deep learning, ILBQA, FPGA implementation, Chemical technology, 020206 networking & telecommunications, Atomic and Molecular Physics, and Optics, [INFO.INFO-OH] Computer Science [cs]/Other [cs.OH], PACS 8542, 020201 artificial intelligence & image processing, Neural Networks, Computer
Abstract

This paper presents the construction of a new objective method for estimation of visual perceiving quality. The proposal provides an assessment of image quality without the need for a reference image or a specific distortion assumption. Two main processes have been used to build our models: The first one uses deep learning with a convolutional neural network process, without any preprocessing. The second objective visual quality is computed by pooling several image features extracted from different concepts: the natural scene statistic in the spatial domain, the gradient magnitude, the Laplacian of Gaussian, as well as the spectral and spatial entropies. The features extracted from the image file are used as the input of machine learning techniques to build the models that are used to estimate the visual quality level of any image. For the machine learning training phase, two main processes are proposed: The first proposed process consists of a direct learning using all the selected features in only one training phase, named direct learning blind visual quality assessment DLBQA. The second process is an indirect learning and consists of two training phases, named indirect learning blind visual quality assessment ILBQA. This second process includes an additional phase of construction of intermediary metrics used for the construction of the prediction model. The produced models are evaluated on many benchmarks image databases as TID2013, LIVE, and LIVE in the wild image quality challenge. The experimental results demonstrate that the proposed models produce the best visual perception quality prediction, compared to the state-of-the-art models. The proposed models have been implemented on an FPGA platform to demonstrate the feasibility of integrating the proposed solution on an image sensor.

Published
2021

5. Estimation of Oxide Breakdown Voltage During a CDM Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements

Author

Emmanuel Simeu, Jean-Daniel Arnould, Chloe Troussier, Johan Bourgeat, Blaise Jacquier, Reliable RF and Mixed-signal Systems (RMS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire de Radio-Fréquence et d'Intégration de Circuits (RFIC-Lab ), Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), and Université Grenoble Alpes (UGA)-Université Grenoble Alpes (UGA)

Subjects
010302 applied physics, oxide breakdown, Materials science, [INFO.INFO-OH]Computer Science [cs]/Other [cs.OH], Transistor, CDM, ESD, 020206 networking & telecommunications, 02 engineering and technology, VF-TLP, 01 natural sciences, law.invention, Electric power transmission, Reliability (semiconductor), law, PACS 85.42, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Breakdown voltage, Event (particle physics), Transmission-line pulse, Voltage
Abstract

International audience; Using TLP (Transmission Line Pulse) and VF-TLP (Very Fast Transmission Line Pulse) to emulate a fast transient stress, a study of oxide reliability during a CDM (Charged Devise Model) event was done to establish an empirical law between the time to breakdown and the voltage applied to the gate. A wide array of transistors in different configurations was tested to reflect real situation during a CDM event.

Published
2021

6. Analog and Mixed Signal Diagnosis Flow Using Fault Isolation Techniques and Simulation

Author

Tommaso Melis, Emmanuel Simeu, Etienne Auvray, STMicroelectronics [Grenoble] (ST-GRENOBLE), Reliable RF and Mixed-signal Systems (RMS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), and BEN TITO, Laurence

Subjects
diagnosis, Computer science, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, customer return, Mixed-signal integrated circuit, Fault detection and isolation, Flow (mathematics), Control theory, PACS 85.42, SoC, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, fault simulation, ComputingMilieux_MISCELLANEOUS, emission microscopy
Abstract

Getting accurate fault isolation during failure analysis is mandatory for success of Physical Failure Analysis (PFA) in critical applications. Unfortunately, achieving such accuracy is becoming more and more difficult with today’s diagnosis tools and actual process node such as BCD9 and FinFET 7 nm, compromising the success of subsequent PFA done on defective SoCs. Electrical simulation is used to reproduce emission microscopy, in our previous work and, in this paper, we demonstrate the possibility of using fault simulation tools with the results of electrical test and fault isolation techniques to provide diagnosis with accurate candidates for physical analysis. The experimental results of the presented flow, from several cases of application, show the validity of this approach.

Published
2020

7. Guest Editorial Special Issue on the IEEE International NEWCAS Conference 2020

Author

David, J.P., Barragan, Manuel J., David, Jean-Pierre, École Polytechnique de Montréal (EPM), Reliable RF and Mixed-signal Systems (RMS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), and Université Grenoble Alpes (UGA)

Subjects
[SPI]Engineering Sciences [physics], business.industry, Computer science, 020208 electrical & electronic engineering, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, Telecommunications, business, ComputingMilieux_MISCELLANEOUS, Selection (genetic algorithm)
Abstract

This Special Issue is a selection of the best articles presented at the 18th IEEE International NEWCAS Conference (NEWCAS) 2020 that was held in Montreal, Canada, on June 16–19, 2020. As an Interregional flagship conference of the IEEE Circuits and Systems Society (CASS), this conference covers a wide spectrum of topics, research, and practice in the fields of circuits and systems, and offers an international forum for exchanging ideas and results.

Published
2021

8. A Non-Closed-Form Mathematical Model for Uniform and Non-Uniform Distributed Amplifiers

Author

Antonio Augusto Lisboa de Souza, Manuel J. Barragan, Sylvain Bourdel, Florence Podevin, Mohamad El Chaar, Laboratoire de Radio-Fréquence et d'Intégration de Circuits (RFIC-Lab ), Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Université Grenoble Alpes (UGA), Reliable RF and Mixed-signal Systems (RMS ), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), and Université Grenoble Alpes (UGA)

Subjects
computational modeling, bandwidth, Power gain, Computer science, 020208 electrical & electronic engineering, Bandwidth (signal processing), Semiconductor device modeling, Distributed amplifier, distributed amplifier, analytical model, 020206 networking & telecommunications, Context (language use), gain, 02 engineering and technology, BiCMOS, Artificial transmission line, CMOS, PACS 85.42, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, semiconductor device modeling, mathematical model
Abstract

International audience; A non-closed-form general mathematical model for CMOS distributed amplifier (DA) for broadband applications is presented. Contrary to the artificial transmission line (TL) assumption made in the conventional analytical models, the proposed model treats the DA as a discrete set of cells connected together, and hence considers propagation and mismatch between inter-cells. This approach provides designers with a much more accurate first sizing of the DA compared to conventional ways and, as a result, leads to a reduced design time and complexity. The model enables both quantitative and qualitative analysis of a DA, for the purpose of aiding the designers in predicting the relations between DA performance and its multi-design parameters, especially in the context of non-uniform designs. In addition, it is well suited to Computer-Automated Design (CAutoD), to help in achieving designs having a given set of performance goals. The validation of the model is demonstrated on two designs, by a comparison with simulations done in Keysight's ADS tool and using STMicroelectronics' 55-nm SiGe BiCMOS design kit. First design is inspired from an already published non-uniform DA design while second one proposes a 100-GHz bandwidth CMOS uniform DA with 8 dB of power gain, after using it in a CAutoD process.

Published
2020

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