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2. Near-field microscopy and fluorescence spectroscopy: application to chromosomes labelled with different fluorophores

Author

C. Bisbal, P. Gall-Borrut, T. Salehzada, Laurent Mahieu-Williame, L. Costa, P. Falgayrettes, L. Nativel, Centre de Recherche en Acquisition et Traitement de l'Image pour la Santé (CREATIS), Université Jean Monnet [Saint-Étienne] (UJM)-Hospices Civils de Lyon (HCL)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Centre National de la Recherche Scientifique (CNRS)-Institut National de la Santé et de la Recherche Médicale (INSERM), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Térahertz, hyperfréquence et optique (TéHO), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Centre d'Etude et de Recherche Multimodal Et Pluridisciplinaire en imagerie du vivant (CERMEP - imagerie du vivant), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-CHU Grenoble-Hospices Civils de Lyon (HCL)-CHU Saint-Etienne-Université Jean Monnet [Saint-Étienne] (UJM)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), and Institut de génétique humaine (IGH)

Subjects
Méthodes et systèmes en IRM et optique, Histology, Materials science, genetic structures, Physics::Optics, 02 engineering and technology, Fluorescence spectroscopy, Pathology and Forensic Medicine, 03 medical and health sciences, Optics, Microscopy, Image Processing, Computer-Assisted, categₛt2i, [INFO.INFO-IM]Computer Science [cs]/Medical Imaging, Fluorescence microscope, Chromosomes, Human, Humans, ComputingMilieux_MISCELLANEOUS, Fluorescent Dyes, 030304 developmental biology, Fluorescence loss in photobleaching, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], 0303 health sciences, Total internal reflection fluorescence microscope, Staining and Labeling, business.industry, reseauₙational, 021001 nanoscience & nanotechnology, imagerie_RMNₒptique, Chromatin, Spectrometry, Fluorescence, Light sheet fluorescence microscopy, Near-field scanning optical microscope, Fluorescence cross-correlation spectroscopy, sense organs, 0210 nano-technology, business
Abstract

We have coupled a spectrophotometer with a scanning near-field optical microscope to obtain, with a single scan, simultaneously scanning near-field optical microscope fluorescence images at different wavelengths as well as topography and transmission images. Extraction of the fluorescence spectra enabled us to decompose the different wavelengths of the fluorescence signals which normally overlap. We thus obtained images of the different fluorescence emissions of acridine orange bound to single or double stranded nucleic acids in human metaphase chromosomes before and after DNAse I or RNAse A treatment. The analysis of these images allowed us to visualize some specific chromatin areas where RNA is associated with DNA showing that such a technique could be used to identify multiple components within a cell.

Published
2010

3. MMIC's characterization by very near-field technique

Author

P. Falgayrettes, P. Gall-Borrut, M. Castel, D. Gasquet, M. Marchetti, Michel Castagne, L. Nativel, Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), and Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Engineering, Near and far field, 02 engineering and technology, PROBES, law.invention, Bluetooth, GHZ, law, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrical and Electronic Engineering, Monolithic microwave integrated circuit, Electronic circuit, Cmos power amplifier, business.industry, high-resolution imaging, PLANAR MICROWAVE CIRCUITS, MMICs EMC, 020206 networking & telecommunications, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, [SPI.TRON]Engineering Sciences [physics]/Electronics, Electronic, Optical and Magnetic Materials, Characterization (materials science), RESOLUTION, very near-field measurements, Optoelectronics, 0210 nano-technology, business, Microwave, Planar microwave circuits
Abstract

This paper shows a method to characterize microwave circuits using a near-field scanning microscope. Applied on various samples, it shows good resolution and weak disturbance for ICs operating with very common microwave components. Here, it is applied in an industrial surrounding to characterize the Bluetooth CMOS power amplifier. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 41: 209–213, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20096

Published
2004

4. A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy

Author

Michel Castagne, Jean-Pierre Fillard, P. Gall-Borrut, J. L. Weyher, and Jacques Bonnafe

Subjects
Total internal reflection, Range (particle radiation), Photon, Atomic force microscopy, Chemistry, business.industry, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Optics, Semiconductor, law, Wafer, Scanning tunneling microscope, business, Instrumentation, Beam (structure)
Abstract

Processed InP and GaAs surfaces are studied by synchronous atomic-force (AFM) and photon scanning tunneling microscopy (PSTM). A beam injection system at 1.06 μm in the transparency range of semiconductors is described which makes it possible to perform total internal reflection (TIR) without any specific preparation or shaping on standard wafers.

Published
1998

5. Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses

Author

P. Gall-Borrut, P. Falgayrettes, Michel Castagne, D. Perret, L. Nativel, B. Drevet, Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), and Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS)

Subjects
02 engineering and technology, Iterative reconstruction, 01 natural sciences, Light scattering, Laser beam applications, Optics, 0103 physical sciences, medicine, Optical tomography, Instrumentation, 010302 applied physics, Defect characterization, Experimental study, medicine.diagnostic_test, Chemistry, Scattering, business.industry, Resolution (electron density), Defect density, 021001 nanoscience & nanotechnology, Condensed Matter Physics, [SPI.TRON]Engineering Sciences [physics]/Electronics, Electronic, Optical and Magnetic Materials, Characterization (materials science), Optical method, Amorphous material, Levitation, Glass, Tomography, 0210 nano-technology, business, Laser beams
Abstract

International audience; A specific experimental Laser Scattering Tomography (LST) acquisition procedure is presented. It is adapted to the characterization of materials containing scattering defects ranging from 1 to 102/mm3. The technique makes it possible to obtain good resolution within a volume chosen to contain a statistically significant defect density. This method is used to show that the gas levitation technique makes it possible to significantly decrease scattering defects in glasses. In parallel, individual study of defects in such glasses is also presented.

Published
2004

6. Silicon technology-based micro-systems for atomic force microscopy/photon scanning tunnelling microscopy

Author

Michel Castagne, P. Gall-Borrut, Christian Bergaud, P. Falgayrettes, P. Temple-Boyer, and B. Belier

Subjects
Kelvin probe force microscope, Histology, Materials science, business.industry, Scanning confocal electron microscopy, Atomic force acoustic microscopy, Scanning capacitance microscopy, Conductive atomic force microscopy, Pathology and Forensic Medicine, Optics, Scanning ion-conductance microscopy, business, Non-contact atomic force microscopy, Photoconductive atomic force microscopy
Abstract

We developed silicon nitride cantilevers integrating a probe tip and a wave guide that is prolonged on the silicon holder with one or two guides. A micro-system is bonded to a photodetector. The resulting hybrid system enables us to obtain simultaneously topographic and optical near-field images. Examples of images obtained on a longitudinal cross-section of an optical fibre are shown.

Published
2001

7. Terahertz generation and detection by plasma waves in nanometer gate high electron mobility transistors

Author

Knap, W., Frederic Teppe, Dyakonova, N., Meziani, Y. M., Lusakowski, J., Varani, L., Millithaler, J. F., Laboratoire Charles Coulomb (L2C), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institute of Experimental Physics [Warsaw] (IFD), Faculty of Physics [Warsaw] (FUW), University of Warsaw (UW)-University of Warsaw (UW), Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), and F. Chevrier, T. Taliercio, P. Falgayrettes and P. Gall-Borrut

Subjects
[PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], [SPI.TRON]Engineering Sciences [physics]/Electronics
Abstract

ISBN: 92-990035-0-5; International audience

8. Monte carlo analysis of nano-scale schottky diodes for thz generation

Author

Perez, S., Tomas Gonzalez, Varani, L., Palermo, C., Vaissiere, J. -C, Millithaler, J. -F, Starikov, E., Shiktorov, P., Gruzinskis, V., Reggiani, L., Departamento de Fisica Aplicada, Universidad de Salamanca, Universidad de Salamanca, Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), Semiconductor Physics Institute (Vilnius), Semiconductor Physics Institute, Dipartimento di Ingegneria dell’Innovazione and Istituto Nazionale di Fisica della Materia, Universita` di Lecce, and F. Chevrier, T. Taliercio, P. Falgayrettes and P. Gall-Borrut

Subjects
[PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], [SPI.TRON]Engineering Sciences [physics]/Electronics
Abstract

ISBN : 92-990035-0-5; International audience

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