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In metals geometrically necessary dislocations (GNDs) are generated primarily to accommodate strain gradients and they play a key role in the Bauschinger effect, strain hardening, micron-scale size effects and fatigue. During bending large strain gradients naturally emerge which makes this deformation mode exceptionally suitable to study the evolution of GNDs. Here we present bi-directional bending experiment of a Cu single crystalline microcantilever with in situ characterisation of the dislocation microstructure in terms of high-resolution electron backscatter diffraction (HR-EBSD). The experiments are complemented with dislocation density modelling to provide physical understanding of the collective dislocation phenomena. We find that dislocation pile-ups form around the neutral zone during initial bending, however, these do not dissolve upon reversed loading, rather they contribute to the development of a much more complex GND dominated microstructure. This irreversible process is analysed in detail in terms of the involved Burgers vectors and slip systems to provide an in-depth explanation of the Bauschinger-effect and strain hardening at this scale. We conclude that the most dominant role in this behaviour is played by short-range dislocation interactions., Comment: manuscript submitted to Acta Materialia

Compression experiments on micron-scale specimens and acoustic emission (AE) measurements on bulk samples revealed that the dislocation motion resembles a stick-slip process - a series of unpredictable local strain bursts with a scale-free size distribution. Here we present a unique experimental set-up, which detects weak AE waves of dislocation slip during the compression of Zn micropillars. Profound correlation is observed between the energies of deformation events and the emitted AE signals that, as we conclude, are induced by the collective dissipative motion of dislocations. The AE data also reveal a surprising two-level structure of plastic events, which otherwise appear as a single stress drop. Hence, our experiments and simulations unravel the missing relationship between the properties of acoustic signals and the corresponding local deformation events. We further show by statistical analyses that despite fundamental differences in deformation mechanism and involved length- and time-scales, dislocation avalanches and earthquakes are essentially alike., Comment: Preprint submitted to Nature Communications

Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam (FIB) milling in a scanning electron microscope (SEM), chemical information of sputtered structures can be visualized and located with high lateral and depth resolution. In this paper, a high vacuum (HV) compatible AFM has been installed in a TESCAN FIB-SEM instrument that was equipped with a time-of-flight secondary ion mass spectroscopy (ToF-SIMS) detector. To investigate the crater's depth caused by the ToF-SIMS sputtering, subsequent AFM measurements were performed on a multilayer vertical cavity surface emitting laser (VCSEL) sample. Surface roughness and milling depth were used to aid accurate 3D reconstruction of the sputtered volume's chemical composition. Achievable resolution, surface roughness during sputtering and surface oxidation issues are analysed. Thus, the integration of complementary detectors opens up the ability to determine the sample properties as well as to understand the influence of the analysis method on the sample surface during the analysis., Comment: Submitted (13 Dec. 2019) for review