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11 results on '"Ballarini, V"'

3. Silicon-YBCO buffered multilayers grown by sputtering

Author

Chiodoni, A., Ballarini, V., Botta, D., Camerlingo, C., Fabbri, F., Ferrari, S., Gerbaldo, Roberto, Ghigo, Gianluca, Gozzelino, Laura, Laviano, Francesco, Minetti, Bruno, Pirri, Candido, Tallarida, G., Tresso, Elena Maria, and Mezzetti, Enrica

Published
2003

5. Silicon-YBCO buffered multilayers grown by sputtering

Author

Chiodoni A., Ballarini V., Botta D., Camerlingo C., Fabbri F., Ferrari S., Gerbaldo R., Ghigo G., Gozzelino L., Laviano F., Minetti B., Pirri C. F., Tallarida, G. Tresso E., and Mezzetti E.

Published
2003

9. Optical harmonic generation in amorphous silicon nitride microcavities

Author

Fabrizio Giorgis, Felice Gesuele, P. Maddalena, S. Lettieri, V. Ballarini, Carlo Ricciardi, Gesuele, Felice, Lettieri, S, Maddalena, Pasqualino, Ricciardi, C, Ballarini, V, and Giorgis, F.

Subjects
Amorphous silicon nitride, Nonlinear optics, Optical microcavities, Materials science, amorphous silicon nitride, business.industry, optical microcavitie, nonlinear optics, Energy conversion efficiency, Biophysics, Physics::Optics, Second-harmonic generation, Nonlinear optics, General Chemistry, Nitride, Condensed Matter Physics, Polarization (waves), Biochemistry, Atomic and Molecular Physics, and Optics, 2nd-harmonic generation, Condensed Matter::Materials Science, Wavelength, Optics, Optoelectronics, High harmonic generation, Thin film, business
Abstract

Second harmonic (SH) and third harmonic (TH) generation in amorphous silicon nitride microcavity are experimentally investigated. The transmitted SH and TH signals are measured in the 0.9-1.4 mu m spectral range, showing enhanced nonlinear conversion efficiency corresponding to resonant wavelength and optical band edges. The efficiencies of the SH and TH generation processes are found to be enhanced by about two and one orders of magnitude, respectively, in comparison with the case of reference amorphous silicon nitride sample. The SH spectra can be reasonably interpreted as due to surface/interface harmonic generation, while the TH signal is related to bulk isotropic third-order polarization. The results obtained for the TH signal are discussed in terms of the linear optical properties of amorphous silicon nitride thin films. (c) 2006 Elsevier B.V. All rights reserved.

Published
2006

10. Second-harmonic generation in amorphous silicon nitride microcavities

Author

Stefano Lettieri, S. Di Finizio, P. Maddalena, Fabrizio Giorgis, V. Ballarini, Lettieri, S., DI FINIZIO, S., Maddalena, Pasqualino, Ballarini, V., and Giorgis, F.

Subjects
Materials science, Physics and Astronomy (miscellaneous), business.industry, Physics::Optics, Second-harmonic generation, Polarization (waves), Amorphous solid, Wavelength, Light intensity, Density of states, Optoelectronics, Photonics, business, Order of magnitude
Abstract

We report an experimental observation of optical second-harmonic generation in an amorphous silicon–nitride based planar microcavity. The spectral dependence of the second-harmonic signal is investigated as a function of both wavelength and polarization state of the fundamental beam. The second-harmonic signal is enhanced by two orders of magnitude at the Fabry–Perot resonance. We ascribe the origin of the optical nonlinearity to surface second-harmonic generation occurring at the interfaces of the multilayered structure, where the resonant enhancement is due to the high intracavity fundamental light intensity and to the increase of the photonic density of states. Analysis of polarization dependence shows that interfacial second-order nonlinearity results from a distribution of dipoles directed perpendicularly to the plane of the film and distributed accordingly to an ∞mm point group symmetry.

Published
2002

11. Amorphous Silicon Nitride: a suitable alloy for optical multilayered structures

Author

Maria Losurdo, Fabrizio Giorgis, Giovanni Bruno, V. Ballarini, Carlo Ricciardi, Stefano Lettieri, Felice Gesuele, Lucio Claudio Andreani, Marco Liscidini, Matteo Galli, P. Maddalena, Ricciardi, C, Ballarini, V, Giorgis, F, Galli, M, Liscidini, M, ANDREANI L., C, Losurdo, M, Bruno, G, Lettieri, S, Gesuele, F, Maddalena, Pasqualino, C., Ricciardi, V., Ballarini, M., Galli, M., Liscidini, L. C., Andreani, M., Losurdo, G., Bruno, S., Lettieri, Gesuele, Felice, and F., Giorgis

Subjects
Range (particle radiation), Materials science, business.industry, Alloy, Physics::Optics, Resonance, engineering.material, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Interferometry, Optics, Plasma-enhanced chemical vapor deposition, Materials Chemistry, Ceramics and Composites, engineering, Optoelectronics, Spectroscopic ellipsometry, Thin film, business, Amorphous silicon nitride
Abstract

a-Si1−xNx:H thin films grown by PECVD in a wide compositional range were characterized by spectroscopic ellipsometry and Mach–Zehnder interferometry. Taking advantage from their optical properties, the alloys were fruitfully applied for stratified structures such as distributed Bragg reflectors, conventional and double resonance optical microcavities.

Published
2006

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