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1. Microhardness Creep in Single Crystals of Tin-chalcogenides

Author

VYAS, S. M., DESAI, C. F., SHAH, R. C., and PANDYA, G. R.

Subjects
Turk. J. Phys.,24,(2000),21-28. Full text: pdf Other articles published in the same issue: Turk. J. Phys.,vol.24,iss.1
Abstract

SnSe and SnS have been grown by Bridgman- Stockbarger method. Loading time as a function of vickers microhardness has been measured at different temperatures in the range 303 K to 388K. Al measurement of hardness have been carried out on the cleavage planes. The activation energy for creep has been evaluated to be 2.92 and 1.75 K Cal/mole, respectively, for SnSe and SnS crystals.

Published
2014

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