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第16回宇宙環境シンポジウム (2019年11月12日-13日. 東京都市大学横浜キャンパス), 横浜市, 神奈川県, The 16th Spacecraft Environment Symposium (November 12-13, 2019. Yokohama Campus, Tokyo City University), Yokohama, Kanagawa, Japan, Spacecraft are covered with MLI and OSR for protecting from the hard temperature differential in space environment and keeping the temperature inside of spacecraft. As the satellite are operated in the Van-Allen belt, those insulating materials are exposed by radio-active rays, such as electron and proton. Those charged particles are injected and accumulate in the bulk of materials. And it will be origin of electric static discharge (ESD). There phenomenon may lead to the satellite operation anomaly. Therefore, it is necessary to understand charging phenomena in the bulks of materials for spacecraft based on electronic physics, for reliabilities of long-life operation. In this research, we try to understand the charging phenomena on fluorinated polymer which are used for wire harness. Space charge accumulations in the bulk of the sample irradiated by an electron under DC application were studied using the pulsed electroacoustic (PEA) method., 形態: カラー図版あり, Physical characteristics: Original contains color illustrations, 資料番号: AA1930014002, レポート番号: JAXA-SP-19-009

application/pdf, Detection of defect profile in near surface of Si wafers using an electron beam has been considered with theoretical calculation in order to develop new characterization technique of near surface. Conductivity change induced by carrier excitation electron beam has been calculated based on using two and three layer model under various pulse-width and acceleration energy of the electron beam. Defect profile with 0.1μm can be characterized the pulse-width smaller than 100 ps. The tomography of near surface within Si wafer has been brought by the technique.

application/pdf, Electron-beam exited carrier profiles in Si wafer subsurface are calculated analytically. Carrier profiles can be induced within 1μm using acceleration voltage