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Start Over Descriptor "Design for testability" Language german
1 results on '"Design for testability"'

1. Der testfreundliche Entwurf asynchroner Schaltungen

Author

Schöber, Volker

Subjects
BIST, scan design, MISR, Dewey Decimal Classification::000 | Allgemeines, Wissenschaft::000 | Informatik, Wissen, Systeme::004 | Informatik, Design for testability, self-timed circuits, ddc:621,3, built-in self-test, LFSR, Dewey Decimal Classification::600 | Technik::620 | Ingenieurwissenschaften und Maschinenbau::621 | Angewandte Physik::621,3 | Elektrotechnik, Elektronik, ddc:004
Abstract

[no abstract]

Published
2001
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