1. Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.
- Author
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Agarwal, Akshay, Kasaei, Leila, Xinglin He, Kitichotkul, Ruangrawee, Hitit, Oğuz Kağan, Minxu Peng, Schultz, J. Albert, Feldman, Leonard C., and Goyal, Vivek K.
- Subjects
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FIELD ion microscopy , *PARTICLE beams , *HELIUM ions , *ELECTRON microscopy , *ACQUISITION of data - Abstract
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam. Multiple types of measurement noise limit the ultimate trade-off between the image quality and the incident particle dose, which can preclude useful imaging of dose-sensitive samples. Existing methods to improve image quality do not fundamentally mitigate the noise sources. Furthermore, barriers to assigning a physically meaningful scale make the images qualitative. Here, we introduce ion count-aided microscopy (ICAM), which is a quantitative imaging technique that uses statistically principled estimation of the secondary electron yield. With a readily implemented change in data collection, ICAM substantially reduces source shot noise. In helium ion microscopy, we demonstrate 3x dose reduction and a good match between these empirical results and theoretical performance predictions. ICAM facilitates imaging of fragile samples and may make imaging with heavier particles more attractive. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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