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Four types of barrier detectors based on a type II InAs/InAsSb superlattice with a wide-gap barrier made of a solid AlInAsSb lattice matched to the GaSb buffer were compared. The tested detectors differed in the type of doping of the active layer and the level and type of doping of the contact layer at the barrier. The epitaxial layers were deposited on GaAs (100) substrates using the molecular beam epitaxy method. The spectral and current–voltage characteristics of the analyzed detectors were compared. The highest current responsivities were observed in the structure with a p-type absorber (p+BpN+). Detectors with an n-type absorber (p+Bnn+, n+Bnn+, and nBnn+) show an increase in the current responsivity with an increase in the reverse bias voltage due to the reduction in the undesirable barrier in the valence band. Arrhenius characteristics for the dark current show that only in nBnn+ detectors, it was possible to limit the generation–recombination current. These detectors at 150 K were characterized by the highest normalized detectivity of approximately 3 × 1011 cm · Hz1/2/W. The obtained results were compared with literature data, showing that the parameters of type II superlattice photodetectors are close to those of HgCdTe photodiodes according to the "Rule 07" and "Rule 22" principles. [ABSTRACT FROM AUTHOR]

This paper presents a theoretical analysis of an nBp infrared barrier detector's performance intended to operate at a room temperature (300 K) based on AIIIBV materials—In1-xGaxAsySb1−y quaternary compound—lattice-matched to the GaSb substrate with a p-n heterojunction ternary Al1−xGaxSb barrier. Numerical simulations were performed using a commercial Crosslight Software—package APSYS. The band structure of the nBp detector and the electric field distribution for the p-n heterojunction with and without a potential barrier were determined. The influence of the barrier-doping level on the detector parameters was analyzed. It was shown that Shockley-Read-Hall (SRH) recombination plays a decisive role in carrier transport for lifetimes shorter than 100 ns. The influence of the absorber/barrier thickness on the detector's dark current density and photocurrent was investigated. It was shown that valence band offset does not influence the device's performance. The quantum efficiency reaches its maximum value for an absorber's thickness of ~3 μm. The performed simulations confirmed the possibility of the detector's fabrication exhibiting high performance at room temperature based on quaternary compounds of AIIIBV materials for the short wavelength infrared range. [ABSTRACT FROM AUTHOR]

The performance of long-wave infrared (LWIR) = 0.22 HgCdTe avalanche photodiodes (APDs) was presented. The dark currentvoltage characteristics at temperatures 200 K, 230 K, and 300 K were measured and numerically simulated. Theoretical modeling was performed by the numerical Apsys platform (Crosslight). The effects of the tunneling currents and impact ionization in HgCdTe APDs were calculated. Dark currents exhibit peculiar features which were observed experimentally. The proper agreement between the theoretical and experimental characteristics allowed the determination that the material parameters of the absorber were reached. The effect of the multiplication layer profile on the detector characteristics was observed but was found to be insignificant. [ABSTRACT FROM AUTHOR]

The paper reports on a long-wave infrared (cut-off wavelength ~ 9 μm) HgCdTe detector operating under nbiased condition and room temperature (300 K) for both short response time and high detectivity operation. The ptimal structure in terms of the response time and detectivity versus device architecture was shown. The response time of the long-wave (active layer Cd composition, xCd = 0.19) HgCdTe detector for 300 K was calculated at a level of τs ~ 1 ns for zero bias condition, while the detectivity − at a level of D* ~ 109 cmHz1/2/W assuming immersion. It was presented that parameters of the active layer and P+ barrier layer play a critical role in order to reach τs ≤ 1 ns. An extra series resistance related to the processing (RS+ in a range 5−10 Ω) increased the response time more than two times (τs ~ 2.3 ns).

The dual-band avalanche photodiode (APD) detector based on a HgCdTe material system was designed and analysed in detail numerically. A theoretical analysis of the two-colour APD intended for the mid wavelength infrared (MWIR) and long wavelength infrared (LWIR) ranges was conducted. The main purpose of the work was to indicate an approach to select APD structure parameters to achieve the best performance at high operating temperatures (HOT). The numerical simulations were performed by Crosslight numerical APSYS platform which is designed to simulate semiconductor optoelectronic devices. The current-voltage characteristics, current gain, and excess noise analysis at temperature T = 230 K vs. applied voltage for MWIR (U = 15 V) and LWIR (U = -6 V) ranges were performed. The influence of low and high doping in both active layers and barrier on the current gain and excess noise is shown. It was presented that an increase of the APD active layer doping leads to an increase in the photocurrent gain in the LWIR detector and a decrease in the MWIR device. The dark current and photocurrent gains were compared. Photocurrent gain is higher in both spectral ranges. [ABSTRACT FROM AUTHOR]

This paper presents a thorough analysis of the current–voltage characteristics of uncooled HgCdTe detectors optimized for different spectral ranges. HgCdTe heterostructures were grown by means of metal–organic chemical vapor deposition (MOCVD) on GaAs substrates. The obtained detector structures were measured using a Keysight B1500A semiconductor device analyser controlled via LabVIEW for automation. The experimental characteristics were compared with numerical calculations performed using the commercial platform SimuAPSYS (Crosslight). SimuAPSYS supports detector design and allows one to understand different mechanisms occurring in the analysed structures. The dark current density experimental data were compared with theoretical results at a temperature of 300 K for short, medium, and long wavelength infrared ranges. The dark current density of detectors optimized for different wavelengths was determined using various generation–recombination mechanisms. Proper matching between experimental and theoretical data was obtained by shifting the Shockley–Read–Hall carrier lifetime and the Auger–1 and Auger–7 recombination rates. Exemplary spectral responses were also discussed, giving a better insight into detector performance. The matching level was proven with a theoretical evaluation of the zero-bias dynamic resistance–area product (R0A) and the current responsivity of the designed detectors. [ABSTRACT FROM AUTHOR]

This paper presents examples of infrared detectors with mercury cadmium telluride elaborated at the Institute of Applied Physics, Military University of Technology and VIGO Photonics S.A. Fully doped HgCdTe epilayers were grown with the metal organic chemical vapour deposition technique which provides a wide range of material composition covering the entire infrared range from 1.5 µm to 14 µm. Fundamental issues concerning the design of individual areas of the heterostructure including: the absorber, contacts, and transient layers with respect to their thickness, doping and composition were discussed. An example of determining the gain is also given pointing to the potential application of the obtained devices in avalanche photodiode detectors that can amplify weak optical signals. Selected examples of the analysis of current-voltage and spectral characteristics are shown. Multiple detectors based on a connection in series of small individual structures are also presented as a solution to overcome inherent problems of low resistance of LWIR photodiodes. The HgCdTe detectors were compared with detectors from III-V materials. The detectors based on InAs/InAsSb superlattice materials achieve very comparable parameters and, in some respects, they are even superior to those with mercury cadmium telluride. [ABSTRACT FROM AUTHOR]

A3B5 materials used for the superlattice (SL) fabrication have properties that enable the design of devices optimized for infrared (IR) detection. These devices are used in the military, industry, medicine and in other areas of science and technology. The paper presents the theoretical assessment and analysis of the InAs/InAs1−xSbx type-II superlattice (T2SL) (grown on GaSb buffer layer) strain impact on the bandgap energy and on the effective masses of electrons and holes at 150 K. The theoretical research was carried out with the use of the commercial program SimuApsys (Crosslight). The k·p method was adopted in T2SL modeling. Luttinger coefficients (γ1, γ2 and γ3) were assessed assuming the Kane coefficient F = 0. The bandgap energy of ternary materials (InAsxSb1−x) was determined assuming that the bowing parameter (bg) for the above-mentioned temperature is bg = 750 meV. The cutoff wavelength values were estimated based on the theoretically determined absorption coefficients (from approximation the quadratic absorption coefficient). The bandgap energy was calculated according to the following formula: Eg = 1.24/λcutoff. The theoretical simulations allowed us to conclude that the strain in T2SL causes the Eg shift, which also has an impact on the effective masses me and mh, playing an important role for the device's optical and electrical performance. The T2SLs-simulated results at 150 K are comparable to those measured experimentally. [ABSTRACT FROM AUTHOR]

A theoretical analysis of the mid-wavelength infrared range detectors based on the HgCdTe materials for high operating temperatures is presented. Numerical calculations were compared with the experimental data for HgCdTe heterostructures grown by the MOCVD on the GaAs substrates. Theoretical modelling was performed by the commercial platform SimuAPSYS (Crosslight). SimuAPSYS fully supports numerical simulations and helps understand the mechanisms occurring in the detector structures. Theoretical estimates were compared with the dark current density experimental data at the selected characteristic temperatures: 230 K and 300 K. The proper agreement between theoretical and experimental data was reached by changing Auger-1 and Auger-7 recombination rates and Shockley- Read-Hall carrier lifetime. The level of the match was confirmed by a theoretical evaluation of the current responsivity and zero-bias dynamic resistance area product (R0A) of the tested detectors. [ABSTRACT FROM AUTHOR]

This study reports on photoelectrical performance of the long‐wave infrared HgCdTe high operating temperature (200–230 K) detector for the fast response time operating under unbiased conditions. The detailed analysis of the response time as a function of device architecture was conducted pointing out optimal working conditions and structure. The response time of the long‐wave (xCd = 0.19) HgCdTe detector for temperatures reached by thermoelectrical cooling (200–230 K) was estimated at the level of τs < 0.6 ns for unbiased condition while responsivity Ri ∼ 1.8 A/W and detectivity was assessed at the level of D* ∼ 1.6 × 1010 cm Hz1/2 /W. It was shown that extra series resistance Rseries < 10 Ω (resistance–capacitance time constant) plays a decisive role in order to reach τs < 1 ns meaning that device processing is much more important rather than fundamental limitations imposed by physics. [ABSTRACT FROM AUTHOR]

We investigate the high-operating temperature performance of InAsSb/AlSb heterostructure detectors with cutoff wavelengths near 5 μm at 230 K. The devices have been fabricated with different types of absorbing layers: nominally undoped absorber (with n-type conductivity), and both n- and p-type doped. The results show that the device performance strongly depends on absorber layer type. Generally, the p-type absorber provides higher values of current responsivity than the n-type absorber, but at the same time also higher values of dark current. The device with the nominally undoped absorbing layer shows moderate values of both current responsivity and dark current. Resulting detectivities D* of nonimmersed devices vary from 2 × 109 to 5 × 109 cmHz1/2W-1 at 230 K, which is easily achievable with a two-stage thermoelectric cooler. Optical immersion increases the detectivity up to 5 × 1010 cmHz1/2W-1. [ABSTRACT FROM AUTHOR]

The paper reports on a long-wave infrared (cut-off wavelength ~ 9 µm) HgCdTe detector operating under unbiased condition and room temperature (300 K) for both short response time and high detectivity operation. The optimal structure in terms of the response time and detectivity versus device architecture was shown. The response time of the long-wave (active layer Cd composition, xcd = 0.19) HgCdTe detector for 300 K was calculated at a level of τs ~ 1 ns for zero bias condition, while the detectivity - at a level of D* ~ 109 cmHz1/2/W assuming immersion. It was presented that parameters of the active layer and P+ barrier layer play a critical role in order to reach τs ≤ 1 ns. An extra series resistance related to the processing (Rs+ in a range 5-10 Ω) increased the response time more than two times (τs ~ 2.3 ns). [ABSTRACT FROM AUTHOR]

Theoretical and experimental investigations on the response time improvement of unbiased longwave infrared (LWIR) HgCdTe detectors operating at temperatures T = 230 K were presented. Metal–organic chemical vapor deposition technology is an excellent tool in fabrication of different HgCdTe detector structures with a wide range of composition and donor/acceptor doping and without postgrown ex-situ annealing. The time constant is lower in biased detectors due to Auger-suppression phenomena and reduction of diffusion capacitance related to a wider depletion region. The relatively high bias current requirements and excessive low-frequency noise, which reduces the detectivity of biased detectors, inspire research on the time constant improvement of unbiased detectors. The response time of high-operating temperature LWIR HgCdTe detectors revealed complex behavior being dependent on the applied reverse bias, the operating temperature, the absorber thickness and doping, the series resistance, and the electrical area of the devices. The response time of 2 ns was achieved for unbiased 30 × 30 μm HgCdTe structures with λ50% = 10.6 μm operating at T = 230 K. [ABSTRACT FROM AUTHOR]

This paper presents the current status of medium-wave infrared (MWIR) detectors at the Military University of Technology's Institute of Applied Physics and VIGO System S.A. The metal–organic chemical vapor deposition (MOCVD) technique is a very convenient tool for the deposition of HgCdTe epilayers, with a wide range of compositions, used for uncooled infrared detectors. Good compositional and thickness uniformity was achieved on epilayers grown on 2-in-diameter, low-cost (100) GaAs wafers. Most growth was performed on substrates, which were misoriented from (100) by between 2° and 4° in order to minimize growth defects. The large lattice mismatch between GaAs and HgCdTe required the usage of a CdTe buffer layer. The CdTe (111) B buffer layer growth was enforced by suitable nucleation procedure, based on (100) GaAs substrate annealing in a Te-rich atmosphere prior to the buffer deposition. Secondary-ion mass spectrometry (SIMS) showed that ethyl iodide (EI) and tris(dimethylamino)arsenic (TDMAAs) were stable donor and acceptor dopants, respectively. Fully doped (111) HgCdTe heterostructures were grown in order to investigate the devices' performance in the 3–5 µm infrared band. The uniqueness of the presented technology manifests in a lack of the necessity of time-consuming and troublesome ex situ annealing. [ABSTRACT FROM AUTHOR]

The paper presents electrical and optical properties of interband cascade infrared photodetectors with InAs/GaSb type-II superlattice absorbers. We compare the detection parameters of detectors grown on the native GaSb substrate and lattice-mismatched GaAs substrate and seek solutions to enhance device performance, specifically with using an optical immersion. The detectors grown on GaAs have better detection parameters at room temperature, but, at lower temperatures, the misfit dislocations become more important, and detectors grown on GaSb become better.