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W., Van Winkle W., Mattice J. S., Harrison Elizabeth A., Barker James C., Chesness Jerry L., Smith Ralph E., Shaheeen Donald G., Raney R. Keith, Borton T., Wezernak C. T., Raney R. K., Sherwani Jabbor K., Moreau David H., Eisenberg Norman A., Lynch Cornelius J., Breeding Roger J., Johnson J. D., Foster K. E., Mouat D. A., Clark R., Hyden John William, Owen, Wilfred, Bayfield, Neil G., Barrow, Graham C., Stolz, Stephanie B., Wienckowski, Louis A., Brown, Betram S., Keyfitz, Nathan, Wilson, W. L., Newman, Peter W. G., Bammi, Deepak, Bammi, Dalip, Goddard, James E., Chisholm, Tony, Walsh, Cliff, Brennan, Geoffrey, Thompson, K. S., Richardson, R., Jensen, Clayton E., Brown, Dail W., Mirabito, John A., Cowing, Thomas G., Binghamton, Suny, Siehl, George H., Albrecht, O. 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E., Scott, Frank M., Benz, L. C., Sandoval, F. M., Willis, W. O., Chapman, Peter F., MacDougall, E. B., Peakall, David B., Office of Technology Assessment, and Office of Science and Technology