20 results on '"Bute, Musa"'
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2. Detection and quantification of alkali-silica-reaction (ASR) gel in cement-based mortars using microwave spectral and temporal transmission properties
3. Attractive method for thickness-independent permittivity measurements of solid dielectric materials
4. Reference-plane invariant transmission-reflection method for measurement of constitutive parameters of liquid materials
5. General line-line method for propagation constant measurement of non-reciprocal networks
6. Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements
7. Feasible Extraction Method for Electromagnetic Properties of Multilayer Metamaterials With Short-Circuit Termination.
8. Investigation of near field effects on retrieval of electromagnetic properties of chiral metamaterials and coupling effects of nearby metamaterials
9. Determination of Constitutive Parameters of Strong-Coupled Bianisotropic Metamaterials Using Oblique Incidence Scattering Parameters.
10. Analysis of Solution Pattern of Natural Frequencies by a Graphical Method.
11. Sample Placement Effect During Curing on Microwave Reflection Properties of Early Age Engineered Cementitious Mortar Specimens.
12. Application of the Singular Spectrum Analysis Technique for Phase Constant Determination of Symmetric Reflecting and Nonreflecting Lines.
13. Temporal Behavior of Plane Waves Within an N-Layer Structure by the Ray-Series Method.
14. Investigation of propagation characteristics of a composite material composed of a bianisotropic metamaterial and an isotropic conventional material
15. Electromagnetic Characterization of Thin Dielectric Materials From Amplitude-Only Measurements.
16. Effective Constitutive Parameters Retrieval Method for Bianisotropic Metamaterials Using Waveguide Measurements.
17. Analysis of Near-Field Effects for Electromagnetic Properties of Pasteur Chiral Metamaterial Slabs.
18. Boundary Effects on the Determination of Electromagnetic Properties of Bianisotropic Metamaterials From Scattering Parameters.
19. Thickness-invariant permittivity determination of materials from calibration-independent measurements.
20. Error-Corrected Reflection and Transmission Scattering Parameters of a Two-Port Device.
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