12 results on '"Attila Sulyok"'
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2. Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS
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József Bálint Renkó, Alekszej Romanenko, Péter János Szabó, Attila Sulyok, Péter Petrik, and Attila Bonyár
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Color etching ,Spectroscopic ellipsometry ,Grain orientation ,Low carbon steel ,X-ray photoelectron spectroscopy ,Mining engineering. Metallurgy ,TN1-997 - Abstract
The structural and chemical homogeneity of the developed thin film upon color etching a low-carbon steel specimen with Beraha-I type color etchant was investigated by spectroscopic ellipsometry and electron backscatter diffraction examinations. The obtained layer thickness maps showed a good correlation with the crystallographic orientation of the individual ferrite grains, corresponding well with previous studies that found a relation between etching and layer build-up speeds and the , directions. However, the refractive index map also showed a dependence on the grain orientation, which contradicts previous models that treat the developed interfering layer as a homogenous material with a constant refractive index and chemical composition. Scanning ellipsometry and X-ray photoelectron spectroscopy measurements confirmed that the chemical composition and refractive index of the developed layer are inhomogeneous both along the surface and the thickness of the film. It was shown that the developed layer consists of mainly oxides and sulfides and that the oxygen content decreases, while the Fe content increases along the normal direction from the surface of the film, in good agreement with the increasing refractive index. The observed differences can be related to the different etching speeds of the ferrite grains (Fe dissolution rate), depending on their orientation.
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- 2022
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3. Tuning the nanoscale rippling of graphene with PEGylated gold nanoparticles and ion irradiation
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Zoltán Osváth, Dániel Zámbó, Attila Sulyok, András Pálinkás, and András Deák
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Graphene ripples ,Gold nanoparticles ,Graphene-based hybrid materials ,Ion irradiation ,Defect engineering ,Chemistry ,QD1-999 - Abstract
Here we report a new method combining strain and defect engineering for the periodic modulation of the graphene nanoscale rippling. First, gold nanoparticles of 16 nm in diameter were synthesized by seed-mediated, wet-chemical approach, and thiol-terminated polyethylene glycol (mPEG-SH) molecules were grafted onto their surface. High-density monolayers of the PEGylated gold nanoparticles were successfully prepared on Si substrates by the Langmuir-Blodgett technique. Graphene grown by chemical vapour deposition was transferred onto the nanoparticle monolayer, and characterized by atomic force microscopy, scanning tunneling microscopy, as well as Raman spectroscopy. The induced nanoscale rippling of graphene was fine-tuned by Ar+ ion irradiation.
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- 2021
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4. Surface and Bulk Plasmon Excitation on Aluminum Surface at Small to High Grazing Angles
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Attila Sulyok and Karoly Tőkési
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surface plasmon ,bulk plasmon ,grazing incident electron excitations ,energy loss spectroscopy ,Nuclear and particle physics. Atomic energy. Radioactivity ,QC770-798 - Abstract
We present a series of spectra measured by reflected electron energy loss spectroscopy on an aluminum sample using a cylindrical mirror analyzer. The measurements were performed in the energy range between 250 eV and 2000 eV and with various incident angles, including the grazing geometry of an 88° incident angle. The observed spectra were evaluated and decomposed for surface and bulk excitation. The determined surface plasmon excitations were compared to the elastic peak and to the bulk excitation. We found a slight surface plasmon energy shift with altering glancing angles. We show that this shift exists independently from the bulk plasmon interference.
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- 2022
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5. Multiscale Investigation of the Structural, Electrical and Photoluminescence Properties of MoS2 Obtained by MoO3 Sulfurization
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Salvatore E. Panasci, Antal Koos, Emanuela Schilirò, Salvatore Di Franco, Giuseppe Greco, Patrick Fiorenza, Fabrizio Roccaforte, Simonpietro Agnello, Marco Cannas, Franco M. Gelardi, Attila Sulyok, Miklos Nemeth, Béla Pécz, and Filippo Giannazzo
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MoS2 ,sulfurization ,XPS ,Raman ,TEM ,C-AFM ,Chemistry ,QD1-999 - Abstract
In this paper, we report a multiscale investigation of the compositional, morphological, structural, electrical, and optical emission properties of 2H-MoS2 obtained by sulfurization at 800 °C of very thin MoO3 films (with thickness ranging from ~2.8 nm to ~4.2 nm) on a SiO2/Si substrate. XPS analyses confirmed that the sulfurization was very effective in the reduction of the oxide to MoS2, with only a small percentage of residual MoO3 present in the final film. High-resolution TEM/STEM analyses revealed the formation of few (i.e., 2–3 layers) of MoS2 nearly aligned with the SiO2 surface in the case of the thinnest (~2.8 nm) MoO3 film, whereas multilayers of MoS2 partially standing up with respect to the substrate were observed for the ~4.2 nm one. Such different configurations indicate the prevalence of different mechanisms (i.e., vapour-solid surface reaction or S diffusion within the film) as a function of the thickness. The uniform thickness distribution of the few-layer and multilayer MoS2 was confirmed by Raman mapping. Furthermore, the correlative plot of the characteristic A1g-E2g Raman modes revealed a compressive strain (ε ≈ −0.78 ± 0.18%) and the coexistence of n- and p-type doped areas in the few-layer MoS2 on SiO2, where the p-type doping is probably due to the presence of residual MoO3. Nanoscale resolution current mapping by C-AFM showed local inhomogeneities in the conductivity of the few-layer MoS2, which are well correlated to the lateral changes in the strain detected by Raman. Finally, characteristic spectroscopic signatures of the defects/disorder in MoS2 films produced by sulfurization were identified by a comparative analysis of Raman and photoluminescence (PL) spectra with CVD grown MoS2 flakes.
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- 2022
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6. Effect of Silver Modification on the Photoactivity of Titania Coatings with Different Pore Structures
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Borbála Tegze, Emőke Albert, Boglárka Dikó, Norbert Nagy, Adél Rácz, György Sáfrán, Attila Sulyok, and Zoltán Hórvölgyi
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titania ,sol-gel coating ,photocatalysis ,self-cleaning ,dye degradation ,dye association ,Chemistry ,QD1-999 - Abstract
Nanostructured photoactive systems are promising for applications such as air and water purification, including self-cleaning coatings. In this study, mesoporous TiO2 sol-gel coatings with different pore structures were prepared and modified with silver by two methods: the “mixing” method by adding AgNO3 to the precursor sol, and the “impregnation” method by immersing the samples in AgNO3 solution (0.03 and 1 M) followed by heat treatment. Our aim was to investigate the effects that silver modification has on the functional properties (e.g., those that are important for self-cleaning coatings). Transmittance, band gap energy, refractive index, porosity and thickness values were determined from UV-Vis spectroscopy measurements. Silver content and structure of the silver modified samples were characterized by X-ray photoelectron spectroscopy, Rutherford backscattering spectrometry, High-resolution transmission electron microscopy and Energy Dispersive X-ray Spectrometry elemental mapping measurements. Wettability properties, including photoinduced wettability conversion behavior were investigated by water contact angle measurements. Photoactivity was studied under both UV and visible light with rhodamine 6G and methylene blue dye molecules, at the liquid–solid and air–solid interfaces modeling the operating conditions of self-cleaning coatings. Samples made with “impregnation” method showed better functional properties, in spite of their significantly lower silver content. The pore structure influenced the Ag content achieved by the “impregnation” method, and consequently affected their photoactivity.
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- 2021
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7. Effect of Silver Modification on the Photoactivity of Titania Coatings with Different Pore Structures
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Boglárka Dikó, Norbert Nagy, Zoltán Hórvölgyi, Attila Sulyok, Emőke Albert, Borbála Tegze, Adel Sarolta Racz, and György Sáfrán
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dye degradation ,dye association ,Materials science ,General Chemical Engineering ,sol-gel coating ,Rutherford backscattering spectrometry ,Article ,Contact angle ,Rhodamine 6G ,chemistry.chemical_compound ,Chemistry ,Chemical engineering ,X-ray photoelectron spectroscopy ,chemistry ,Photocatalysis ,General Materials Science ,titania ,Wetting ,Mesoporous material ,Porosity ,QD1-999 ,photocatalysis ,self-cleaning - Abstract
Nanostructured photoactive systems are promising for applications such as air and water purification, including self-cleaning coatings. In this study, mesoporous TiO2 sol-gel coatings with different pore structures were prepared and modified with silver by two methods: the “mixing” method by adding AgNO3 to the precursor sol, and the “impregnation” method by immersing the samples in AgNO3 solution (0.03 and 1 M) followed by heat treatment. Our aim was to investigate the effects that silver modification has on the functional properties (e.g., those that are important for self-cleaning coatings). Transmittance, band gap energy, refractive index, porosity and thickness values were determined from UV-Vis spectroscopy measurements. Silver content and structure of the silver modified samples were characterized by X-ray photoelectron spectroscopy, Rutherford backscattering spectrometry, High-resolution transmission electron microscopy and Energy Dispersive X-ray Spectrometry elemental mapping measurements. Wettability properties, including photoinduced wettability conversion behavior were investigated by water contact angle measurements. Photoactivity was studied under both UV and visible light with rhodamine 6G and methylene blue dye molecules, at the liquid–solid and air–solid interfaces modeling the operating conditions of self-cleaning coatings. Samples made with “impregnation” method showed better functional properties, in spite of their significantly lower silver content. The pore structure influenced the Ag content achieved by the “impregnation” method, and consequently affected their photoactivity.
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- 2021
- Full Text
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8. Evaluation of the inelastic mean free path (IMFP) of electrons in polyaniline and polyacetylene samples obtained from elastic peak electron spectroscopy (EPES)
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G. Gergely, Miklós Menyhárd, A. Kosiński, Aleksander Jablonski, S. Gurban, Dezső Varga, Beata Lesiak, József Tóth, and Attila Sulyok
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Elastic scattering ,36.20.-r ,Materials science ,epes ,Physics ,QC1-999 ,34.80.bm ,General Physics and Astronomy ,chemistry.chemical_element ,Electron ,Inelastic mean free path ,Electron spectroscopy ,surface excitation ,chemistry.chemical_compound ,Polyacetylene ,X-ray photoelectron spectroscopy ,chemistry ,imfp ,Polyaniline ,Atomic physics ,Helium ,polymers - Abstract
The inelastic mean free path (IMFP) of electrons was determined experimentally for selected polyaniline and polyacetylene samples with Ag and Ni references using elastic peak electron spectroscopy (EPES). The surface composition was determined by XPS and density by helium pycnometry. The high resolution hemispherical ESA-31 and ADES-400 spectrometers were used for measurements in the energy range E = 0.5–3.0 keV and E =0.4 − 1.6 keV, respectively. The integrated elastic peak intensity ratios for sample and reference were calculated using the Monte Carlo (MC) algorithm based on the electron elastic scattering cross-sections database NIST SRD64 version 3.1 and applying TPP-2M IMFPs for polymers. Surface excitation parameters (SEP) and material parameters (ach) for polymers were determined, using the model of Chen, from comparison of measured and MC calculated elastic peak intensity ratios. These corrections proved to be efficient in decreasing the percentage deviations between the obtained IMFPs and the TPP-2M formula IMFPs. The elastic peak of hydrogen was observed in the EPES spectra of polymers. The experimental contribution of the hydrogen to the total elastic peak was 0.58%, while this value obtained from the MC simulations was 1.98%.
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- 2007
9. Growing imbedded Ni3C-rich layer with sharp interfaces by means of ion beam mixing of C/Ni layers
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János L. Lábár, Miklós Menyhárd, Arpad Barna, Peter Panjan, Attila Tóth, Attila Sulyok, L. Kotis, Research Institute for Technical Physics and Materials Science (MFA), Hungarian Academy of Sciences (MTA), and Jozef Stefan Institute [Ljubljana] (IJS)
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010302 applied physics ,Acoustics and Ultrasonics ,Ion beam mixing ,Analytical chemistry ,chemistry.chemical_element ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,Fluence ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Ion ,chemistry ,Transmission electron microscopy ,Metastability ,0103 physical sciences ,Physical Sciences ,Irradiation ,0210 nano-technology ,Carbon ,Layer (electronics) - Abstract
C/Ni bilayers of various layer thicknesses (20–40 nm) were ion bombarded using Ga+ and Ni+ projectiles of energies 20 and 30 keV. Ion bombardment resulted in the growth of a Ni3C rich layer with the following features: (a) sharp carbon/Ni3C rich layer interface, (b) the amount of Ni3C produced by the irradiation proportional to the square root of the fluence and dependent on the type of projectile, (c) good correlation between the distribution of vacancies produced by the ion bombardment and the distribution of Ni3C. The formation of the metastable Ni3C compound was explained by a vacancy-assisted process. The sharp interface is the consequence of a relaxation process removing the intermixed Ni from the carbon layer. The square root of fluence dependence of the thickness of the Ni3C-rich layer can be explained by a usual diffusion equation considering moving boundaries.
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- 2011
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10. Intercomparison of Methods for Separation of REELS Elastic Peak Intensities for Determination of IMFP
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Sven Tougaard, Attila Sulyok, Miklós Menyhárd, J. Pavluch, G. Gergely, Aleksander Jablonski, D. Varga, József Tóth, and M. Krawczyk
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Elastic scattering ,Background subtraction ,Spectrometer ,Scattering ,Chemistry ,business.industry ,Analyser ,Monte Carlo method ,Surfaces and Interfaces ,General Chemistry ,Inelastic scattering ,Condensed Matter Physics ,Surfaces, Coatings and Films ,Computational physics ,Root mean square ,Optics ,Materials Chemistry ,business - Abstract
The consistency and accuracy of inelastic electron mean free paths (IMFPs) determined from comparison of the intensity of elastically reflected electrons with theoretical calculations were studied. The variation with experimental geometry, spectrometer energy resolution and the procedure for background subtraction was studied. Four different types of spectrometers-double pass cylindrical mirror analyser (CMA) preretarded CMA, hemispherical analyser (HSA) and retarding field analyser (RFA) - with widely different geometries and energy resolutions, placed in four different laboratories in three countries, were used. Four background subtraction methods (Shirley, linear, Tougaard and ELPSEP) were applied to isolate the elastic peak intensity from the reflected electron spectra. It was found that the IMFPs determined with data from the double pass CMA deviated considerably more (by a factor of 2) from the average values as well as from theoretical IMFP values than IMFPs determined with data from the other spectrometers. The data from the double pass CMA were therefore excluded from the statistical analysis. The root mean square (RMS) deviation of the IMFP from a function fitted to the data was 1.6-2.8 A, depending on the background subtraction method, and it is smallest for the Tougaard method. The RMS deviation from IMFP values calculated by Tanuma et al. is 2.1-3.2 A, again with the smallest value for the Tougaard method. The percentage deviation of the results using a Tougaard background from Tanuma et al. values is 12.6%. The results point to the conclusion that the major contribution to the inaccuracies in IMFPs determined with this method is not the background subtraction procedure but rather the lack of accuracy of the presently available models for elastic electron scattering, i.e. atomic elastic scattering cross-sections and effects of crystallinity that are not included in the presently applied models.
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- 2001
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11. Interdiffusion in amorphous Si/Ge multilayers by Auger depth profiling technique
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Miklós Menyhárd, Attila Csik, Zoltán Erdélyi, Attila Sulyok, Dezső L. Beke, and Gábor A. Langer
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Materials science ,Silicon ,Diffusion ,Analytical chemistry ,General Physics and Astronomy ,chemistry.chemical_element ,Germanium ,Fizikai tudományok ,Amorphous solid ,Auger ,Condensed Matter::Materials Science ,chemistry ,Természettudományok ,Homogeneous ,Layer (electronics) ,Solid solution - Abstract
It has been shown by the Auger depth profiling technique that the concentration profile at the initially sharp Si/Ge interface in amorphous Si/Ge multilayers shifted but remained still sharp after a heat treatment at 680 K for 100 h. At the same time the fast diffusion of Si resulted in the formation of an almost homogeneous Ge(Si) amorphous solid solution, while there was practically no diffusion of Ge into the Si layer. This is direct evidence on the strong concentration dependence of the interdiffusion coefficient in amorphous Si/Ge system, and it is in accordance with the previous indirect result obtained from the measurements of the decay of the small angle Bragg peaks, as well as with finite difference simulations.
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- 2001
12. Calculation of the Surface Excitation Parameter for Si and Ge from Measured Electron Backscattered Spectra by Means of a Monte-Carlo Simulation.
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Gábor Tamás Orosz, Attila Sulyok, György Gergely, Sándor Gurbán, and Miklós Menyhard
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- 2003
- Full Text
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