Search

Defects can significantly modify the electro-optical characteristics of InGaN light-emitting diodes (LEDs); however, modeling the impact of defects on the electrical characteristics of LEDs is not straightforward. In this paper, we present an extensive investigation and modeling of the impact of defects on the electrical characteristics of InGaN-based LEDs, as a function of the thickness of the quantum well (QW). First, we demonstrate that the density of defects in the active region of III-N LEDs scales with increasing thickness of the InGaN QW. Since device layers with high indium content tend to incorporate more defects, we ascribed this experimental evidence to the increased volume of defects-rich InGaN associated to thicker InGaN layers. Second, we demonstrate that the current–voltage characteristics of the devices are significantly influenced by the presence of defects, especially in the sub turn-on region. Specifically, we show that the electrical characteristics can be effectively modeled in a wide current range (from pA to mA), by considering the existence of trap-assisted tunneling processes. A good correspondence is obtained between the experimental and simulated electrical characteristics (I–V), by using—in the simulation—the actual defect concentrations/activation energies extracted from steady-state photocapacitance, instead of generic fitting parameters. [ABSTRACT FROM AUTHOR]

The electron capture time in single quantum wells is calculated by considering capture and escape as scattering events in Monte Carlo simulation. The calculation is performed for an AlGaAs/GaAs quantum well as a function of the well width at 300 K. The overall capture time of carriers is found to be controlled by the transition from the free state to the uppermost confined levels. Subsequent interband transitions cause rapid decay into lower levels. [ABSTRACT FROM AUTHOR]

In a combined experimental and numerical investigation, we present the effects of trap-assisted tunneling on the sub-threshold forward bias characteristics of a blue InGaN/GaN single-quantum-well LED test structure grown on a SiC substrate. The different role of donor- and acceptor-like traps has been studied, for the information it can provide on the role played by point defects. Using the energy Et and trap density Nt as the only tunneling-related fitting parameters, the behavior of the measured I( V) curves is well reproduced by our model over a wide current and temperature range. The very good agreement between simulations and experiments suggests that trap-assisted forward tunneling is one of the most relevant contributions to the current flow below the optical turn-on of the diode. [ABSTRACT FROM AUTHOR]

A self-energy-based model for the calculation of the electron capture time through phonon emission in presence of carrier population is applied to nitride-based quantum wells (QWs). The role of plasma dynamical screening on the Frölich interaction is investigated, highlighting its central role in the dependence of capture time on carrier density. The proposed approach yields a closed-form expression for capture time as a function of the carrier densities in QW and barrier states. Its application to simple two-population rate equations allows to reproduce available experimental data with excellent agreement, offering an accurate yet practical alternative to the usual approximation of a constant capture time in modeling light-emitting diodes and lasers. [ABSTRACT FROM AUTHOR]

A microscopic model, based on a full-Brillouin-zone description of the electronic structure, is used to investigate Auger transitions in InGaN/GaN quantum wells. The lack of momentum conservation along the confining direction enhances direct (i.e., phononless) Auger transitions, leading to Auger coefficients in the range of those predicted for phonon-dressed processes in bulk InGaN. The dependence of Auger coefficients on temperature and quantum well thickness is analyzed. The limitations of conventional multiband models, based on zone-center approximations of the band structure, are discussed. [ABSTRACT FROM AUTHOR]

2-D numerical simulation is employed to assess a number of possible design approaches aimed at optimizing the internal quantum efficiency (IQE) of ZnO-based light-emitting diodes (LEDs) grown along the c-axis. First, the relative performance of similar ZnO-based and GaN-based LED structures is compared and discussed. Second, the effects on IQE of thickness, doping, and alloy composition of the MgZnO electron blocking layer (EBL) is studied in order to maximize the carrier confinement in the active region. The optimum number of quantum wells is also addressed, and different strategies for barrier doping are considered, showing that, if the EBL is doped p-type, a similar doping in the barriers is not required to compensate for the spontaneous and piezoelectric interface charges and to enhance hole transport. Different choices of the geometrical and doping parameters of the n-type access region are considered, and the impact of different values of the electron mobility is determined. Finally, the analysis of a ZnO/BeZnO LED structure suggests that the incorporation of BeZnO layers does not provide significant advantages. [ABSTRACT FROM PUBLISHER]

As a preparatory step toward establishing reliable numerical design tools for ZnO-based optoelectronic devices, we have reassessed the available information on material parameters relevant for the simulation of light-emitting diodes (LEDs) with active regions including ZnO, MgZnO, and BeZnO layers. The impact of different approximations for the electronic structure and the interface polarization charge on the optical properties of bulk ZnO and ZnO/MgZnO quantum wells has been evaluated, and a consistent set of parameters has been used not only for systematic comparison of ZnO/MgZnO and ZnO/BeZnO single quantum well structures but also for the first simulation of a realistic ZnO/BeZnO multiple quantum well LED. [ABSTRACT FROM AUTHOR]

Physical mechanisms causing the efficiency droop in InGaN/GaN blue light-emitting diodes and remedies proposed for droop mitigation are classified and reviewed. Droop mechanisms taken into consideration are Auger recombination, reduced active volume effects, carrier delocalization, and carrier leakage. The latter can in turn be promoted by polarization charges, inefficient hole injection, asymmetry between electron and hole densities and transport properties, lateral current crowding, quantum-well overfly by ballistic electrons, defect-related tunneling, and saturation of radiative recombination. Reviewed droop remedies include increasing the thickness or number of the quantum wells, improving the lateral current uniformity, engineering the quantum barriers (including multi-layer and graded quantum barriers), using insertion or injection layers, engineering the electron-blocking layer (EBL) (including InAlN, graded, polarization-doped, and superlattice EBL), exploiting reversed polarization (by either inverted epitaxy or N-polar growth), and growing along semi- or non-polar orientations. Numerical device simulations of a reference device are used through the paper as a proof of concept for selected mechanisms and remedies. [ABSTRACT FROM AUTHOR]

The role of deep defects and their physical origin in InGaN/GaN LED are still widely investigated and debated, in particular their impact on the electrical and optical characteristics and on the reliability of the device. In this paper we evaluate the electrical and optical behavior of a single quantum well InGaN/GaN 420 nm LED during a medium-term accelerated ageing test. From these measurements, an increase in the sub-turn on current was observed: this process was ascribed to the stress-induced generation of defects in proximity of the active region and thus related to an increase of the correlated trap assisted tunneling. Subsequently we modelled the device electrical characteristics, evidencing the fundamental role of deep defects in determining the shape of the I-V curve in low forward bias. We reproduced with high accuracy the experimental current-voltage curves acquired during the ageing test, demonstrating that the increase in forward leakage can be entirely ascribed to the increase in concentration of a sole defect deep level located near midgap. These results provide a better understanding about the defect formation mechanism, that can be used to model and understand the behavior of the devices during ageing. • SQW InGaN/GaN LED under constant current stress test • Deep defects • Increase in trap assisted tunneling-related current observed • A model capable of emulating the electrical behavior of the devices • Simulations highlight the role of deep levels in the quite early ageing of the device [ABSTRACT FROM AUTHOR]