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Investigates the resonant magnetization tunneling process involved in the trigonal pyramidal manganese complex. Equation for the complex; Reference to the magnetic properties of single molecule magnets; Indentification of single-molecule magnets; Methods used to conduct studies on single-molecule magnets.

Magnetization measurements of soft-magnetic materials can be affected if they are characterized using a superconducting solenoid. Recording hysteresis loops while stepping the magnetic field can cause an apparently inverted hysteresis, if due to the pinned remanent flux in the magnet the field at the sample location exceeds the sample’s coercive field. Hysteresis loops recorded while sweeping the field can also be affected by ramping rate. The sweeping-rate dependence is caused by leakage currents resulting from the persistent switch and synchronization issues regarding collection of magnetic moment and field data. The resulting errors can be estimated by measuring paramagnetic dysprosium oxide. [ABSTRACT FROM AUTHOR]

Depth profiles for pinned and unpinned magnetizations were determined across the interface between a ferromagnet (F) and random and dilute antiferromagnets (RAF and DAF) exemplified by Fe0.45Ni0.55F2/Co and Fe0.45n0.66F2/Co bilayers, respectively, using polarized neutron reflectivity (PNR). PNR measurements were complemented by magnetometry using applied fields as large as 160 kOe to assure saturation of the entire sample, including magnetic moments that are normally pinned at lower fields. The locations of pinned and unpinned magnetization in the ferro- and antiferromagnets were identified. The origin of exchange bias in the RAF system is noticeably different than that of the DAF system. In the RAF system, a domain wall is formed at the RAF/F interface when the ferromagnet's magnetization is reversed. In the DAF system, some domains within the bulk of the DAF are reversed upon reversal of the ferromagnet while others remain pinned. In this case, the interface magnetization is entirely reversed. [ABSTRACT FROM AUTHOR]