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1 results on '"Fourmaux, S."'

1. Non-thermal melting in semiconductors measured at femtosecond resolution.

Author

Rousse, A., Rischel, C., Fourmaux, S., Uschmann, I., Sebban, S., Grillon, G., Balcou, Ph., Forster, E., Geindre, J.P., Audebert, P., Gauthier, J.C., and Hulin, D.

Subjects
*SEMICONDUCTORS, *FUSION (Phase transformation), *OPTICAL spectrometers, *ATOMIC structure
Abstract

Presents measurements of the characteristic melting time of InSb with a technique of ultrafast time-resolved X-ray diffraction that provides a direct probe of the changing atomic structure. How the electronic energy is converted into thermal motions; Application for this ability to obtain the quantitative structural characterization of non-thermal processes in semiconductors.

Published
2001
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