1. Spin polarized La0.7Sr0.3MnO3 thin films on silicon
- Author
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Bergenti, I., Dediu, V., Arisi, E., Cavallini, M., Biscarini, F., Taliani, C., de Jong, M.P., Dennis, C.L., Gregg, J.F., Solzi, M., and Natali, M.
- Subjects
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MANGANITE , *THIN films , *THICK films , *SPINTRONICS - Abstract
Abstract: La0.7Sr0.3MnO3 polycrystalline manganite thin films were grown on silicon (Si) substrates covered by SiO x amorphous native oxide. Curie temperatures of about 325K were achieved for 70-nm-thick films. Strong room temperature XMCD signal was detected indicating high spin polarization at the surface. Cross-sectional TEM images show sharp interface between SiO x and manganite without signature of chemical reaction at the interface. Unusual sharp splitting of the manganite film was observed: on the top of a transition layer characterized by low crystalline order, a magnetically robust layer is formed. [Copyright &y& Elsevier]
- Published
- 2007
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