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As the selection of material for particular engineering properties becomes increasingly important in keeping costs down, methods for evaluating material properties also become more relevant. One such method examines the geometry of grain boundaries, which reveals much about the properties of the material.Studying material properties from their geometrical measurements, The Measurement of Grain Boundary Geometry provides a framework for a specialized application of electron microscopy for metals and alloys and, by extension, for ceramics, minerals, and semiconductors. The book presents an overview of the developments in the theory of grain boundary geometry and its practical applications in material engineering. It also covers the tunneling electron microscope (TEM), experimental aspects of data collection, data processing, and examples from actual investigations. Each step of the analysis process is clearly described, from data collection through processing, analysis, representation, and display to applications. The book also includes a glossary of terms.Exploring both the experimental and analytical aspects of the subject, this practical reference guide is essential for researchers and students involved in material properties, whether in physics, materials science, metallurgy, or physical chemistry.

Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.

Volume 36 provides an extensive introduction to magnetic imaging,including theory and practice, utilizing a wide range of magnetic sensitive imaging methods. It also illustrates the applications of these modern experimental techniques together with imaging calculations to today's advanced magnetic materials. This book is geared towards the upper-level undergraduate students and entry-level graduate students majoring in physics or materials science who are interested in magnetic structure and magnetic imaging. Researchers involved in studying magnetic materials should alsofind the book useful as it consistently summarizes the recent progress in this field. The book covers today's most advanced magnetic imaging techniques, comprehensively written with about 150 figures and more than 300 references to the scientific literature

Advances in Electronics and Electron Physics

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara­ interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.

Three Dimensional Microanatomy of Cells and Tissue Surfaces focuses on the use of scanning electron microscopy in the study of the microanatomy of cells and tissues, cell relationships, and complex biological relationships. The selection first elaborates on the technical aspects of stereoprojection for electron microscopy; three-dimensional microanatomy of intracellular structures; microcirculation studies by the injection-replica method with special reference to portal circulations; and three-dimensional architecture of the mammalian liver. Discussions focus on the preparation of vascular casts, portal circulations of various organs, scanning electron microscopy, copying and printing stereopair negatives, stereoprojection, and high voltage electron microscopy. The text then takes a look at scanning electron microscope bloodvessel casts analysis, three dimensional microanatomy of reticular tissues, kidney glomerular epithelium in response to different physiological states and experimental conditions, and mammalian renal papilla and pelvis. The manuscript examines the lung in scanning electron microscopy and stereopresentation, surface topography of endocardial endothelium, scanning electron microscopy of endothelium, human vas deferens, and seminal vesicles, and dynamic morphology of the apical membrane of lactating cells viewed by freeze-fracture. The selection is a valuable reference for researchers interested in the use of scanning electron microscopy in the study of the microanatomy of cells and tissues and biological relationships.

Advances in Electronics and Electron Physics