Search

Copyright of Journal of Harbin Institute of Technology. Social Sciences Edition / Haerbin Gongye Daxue Xuebao. Shehui Kexue Ban is the property of Harbin Institute of Technology and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

An advanced local binary patterns method is proposed to precisely describe image features. Adaptive local binary patterns (ALBP) method selects the frequently occurred patterns to construct the main pattern set, which avoids using the same pattern set to depict different texture structures in traditional uniform local binary patterns. Based on the proposed method an effective fabric defect detection algorithm is designed. First the features of free defect image are extracted according to the main pattern set and the threshold is confirmed. Then the image to be tested is divided into same size detection windows from which ALBP features are also extracted. The features are compared with the threshold to find the defective window. The experiments exhibit the detection effect of the proposed method is comparatively better than traditional LBP from visual aspect and detection accuracy. [ABSTRACT FROM AUTHOR]