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A method to fit Compton profiles in x‐ray fluorescence (XRF) spectroscopy using a line shape calculated from first principles is proposed. The fitting procedure incorporates the Compton profile calculations and the double Compton scattering line shape algorithm. The results demonstrate the effectiveness of the fitting approach in accurately describing the measured scattering spectra, with good agreement observed between the fit and experimental data. The findings of this study can be used for more accurate characterization of the scattering peaks in XRF spectroscopy. [ABSTRACT FROM AUTHOR]

X‐ray spectra scattered at 90° by acrylic resin plates of various thicknesses are measured. The intensity and polarization of Compton‐scattered X‐rays are estimated from the spectra. As the thickness of the slab increases, the intensity increases but the polarization decreases. The optimal thickness for a polarized X‐ray fluorescence spectrometer is determined, which provides both high intensity and high polarization. [ABSTRACT FROM AUTHOR]