7 results on '"Klapetek Petr"'
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2. The development of the spatially correlated adjustment wavelet filter for atomic force microscopy data
3. Methods for topography artifacts compensation in scanning thermal microscopy
4. One-dimensional autocorrelation and power spectrum density functions of irregular regions
5. Near-field scanning optical microscope probe analysis
6. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
7. Theoretical analysis of the atomic force microscopy characterization of columnar thin films
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