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We describe a methodology to obtain three-dimensional models of engineered surfaces using scanning electron microscopy and multi-view photogrammetry (3DSEM). For the reconstruction of the 3D models of the surfaces we used freeware available in the cloud. The method was applied to study the surface roughness of metallic samples patterned with parallel grooves by means of laser. The results are compared with measurements obtained using stylus profilometry (PR) and SEM stereo-photogrammetry (SP). The application of 3DSEM is more time demanding than PR or SP, but it provides a more accurate representation of the surfaces. The results obtained with the three techniques are compared by investigating the influence of sampling step on roughness parameters. [ABSTRACT FROM AUTHOR]

We have applied aberration-corrected transmission electron microscopy (TEM) imaging and electron energy loss spectroscopy (EELS) to study the structure and chemistry of epitaxial ceria thin films, grown by pulsed laser deposition onto (001) yttria-stabilized zirconia (YSZ) substrates. There are few observable defects apart from the expected mismatch interfacial dislocations and so the films would be expected to have good potential for applications. Under high electron beam dose rate (above about 6000 e - /Å 2 s) domains of an ordered structure appear and these are interpreted as being created by oxygen vacancy ordering. The ordered structure does not appear at lower lose rates (ca. 2600 e - /Å 2 s) and can be removed by imaging under 1 mbar oxygen gas in an environmental TEM. EELS confirms that there is both oxygen deficiency and the associated increase in Ce 3+ versus Ce 4+ cations in the ordered domains. In situ high resolution TEM recordings show the formation of the ordered domains as well as atomic migration along the ceria thin film (001) surface. [ABSTRACT FROM AUTHOR]

The use of transmission electron microscopy (TEM) for the structural characterization of many nanostructured hydrides, which are relevant for solid state hydrogen storage, is hindered due to a rapid decomposition of the specimen upon irradiation with the electron beam. Environmental TEM allows to stabilize the hydrides by applying a hydrogen back pressure of up to 4.5 bar in a windowed environmental cell. The feasibility of high-resolution TEM (HRTEM) investigations of light weight metals and metal hydrides in such a “nanoreactor” is studied theoretically by means of multislice HRTEM contrast simulations using Mg and its hydride phase, MgH 2 , as model system. Such a setup provides the general opportunity to study dehydrogenation and hydrogenation reactions at the nanoscale under technological application conditions. We analyze the dependence of both the spatial resolution and the HRTEM image contrast on parameters such as the defocus, the metal/hydride thickness, and the hydrogen pressure in order to explore the possibilities and limitations of in-situ experiments with windowed environmental cells. Such simulations may be highly valuable to pre-evaluate future experimental studies. [ABSTRACT FROM AUTHOR]

In this work, a recently developed quantitative approach based on the principles of detection theory is used in order to determine the possibilities and limitations of High Resolution Scanning Transmission Electron Microscopy (HR STEM) and HR TEM for atom-counting. So far, HR STEM has been shown to be an appropriate imaging mode to count the number of atoms in a projected atomic column. Recently, it has been demonstrated that HR TEM, when using negative spherical aberration imaging, is suitable for atom-counting as well. The capabilities of both imaging techniques are investigated and compared using the probability of error as a criterion. It is shown that for the same incoming electron dose, HR STEM outperforms HR TEM under common practice standards, i.e. when the decision is based on the probability function of the peak intensities in HR TEM and of the scattering cross-sections in HR STEM. If the atom-counting decision is based on the joint probability function of the image pixel values, the dependence of all image pixel intensities as a function of thickness should be known accurately. Under this assumption, the probability of error may decrease significantly for atom-counting in HR TEM and may, in theory, become lower as compared to HR STEM under the predicted optimal experimental settings. However, the commonly used standard for atom-counting in HR STEM leads to a high performance and has been shown to work in practice. [ABSTRACT FROM AUTHOR]

Automated crystal orientation mapping for transmission electron microscopy (ACOM-TEM) has become an easy to use method for the investigation of crystalline materials and complements other TEM methods by adding local crystallographic information over large areas. It fills the gap between high resolution electron microscopy and electron back scatter diffraction in terms of spatial resolution. Recent investigations showed that spot diffraction ACOM-TEM is a quantitative method with respect to sample parameters like grain size, twin density, orientation density and others. It can even be used in combination with in-situ tensile or thermal testing. However, there are limitations of the current method. In this paper we discuss some of the challenges and discuss solutions, e.g. we present an ambiguity filter that reduces the number of pixels with a ‘180° ambiguity problem’. For that an ACOM-TEM tilt series of nanocrystalline Pd thin films with overlapping crystallites was acquired and analyzed. [ABSTRACT FROM AUTHOR]

High-resolution transmission electron microscopy (HRTEM) examination of nanoparticles requires their placement on some manner of support – either TEM grid membranes or part of the material itself, as in many heterogeneous catalyst systems – but a systematic quantification of the practical imaging limits of this approach has been lacking. Here we address this issue through a statistical evaluation of how nanoparticle size and substrate thickness affects the ability to resolve structural features of interest in HRTEM images of metallic nanoparticles on common support membranes. The visibility of lattice fringes from crystalline Au nanoparticles on amorphous carbon and silicon supports of varying thickness was investigated with both conventional and aberration-corrected TEM. Over the 1–4 nm nanoparticle size range examined, the probability of successfully resolving lattice fringes differed significantly as a function both of nanoparticle size and support thickness. Statistical analysis was used to formulate guidelines for the selection of supports and to quantify the impact a given support would have on HRTEM imaging of crystalline structure. For nanoparticles ≥1 nm, aberration-correction was found to provide limited benefit for the purpose of visualizing lattice fringes; electron dose is more predictive of lattice fringe visibility than aberration correction. These results confirm that the ability to visualize lattice fringes is ultimately dependent on the signal-to-noise ratio of the HRTEM images, rather than the point-to-point resolving power of the microscope. This study provides a benchmark for HRTEM imaging of crystalline supported metal nanoparticles and is extensible to a wide variety of supports and nanostructures. [ABSTRACT FROM AUTHOR]

The geometric phase analysis (GPA) algorithm is known as a robust and straightforward technique that can be used to measure lattice strains in high resolution transmission electron microscope (TEM) images. It is also attractive for analysis of aberration-corrected scanning TEM (ac-STEM) images that resolve every atom column, since it uses Fourier transforms and does not require real-space peak detection and assignment to appropriate sublattices. Here it is demonstrated that, in ac-STEM images of compound materials with compositionally distinct atom columns, an additional geometric phase is present in the Fourier transform. If the structure changes from one area to another in the image (e.g. across an interface), the change in this additional phase will appear as a strain in conventional GPA, even if there is no lattice strain. Strategies to avoid this pitfall are outlined. [ABSTRACT FROM AUTHOR]

Here, we present a numerical post-processing method for removing the effect of anti-symmetric residual aberrations in high-resolution transmission electron microscopy (HRTEM) images of weakly scattering 2D-objects. The method is based on applying the same aberrations with the opposite phase to the Fourier transform of the recorded image intensity and subsequently inverting the Fourier transform. We present the theoretical justification of the method, and its verification based on simulated images in the case of low-order anti-symmetric aberrations. Ultimately the method is applied to experimental hardware aberration-corrected HRTEM images of single-layer graphene and MoSe 2 resulting in images with strongly reduced residual low-order aberrations, and consequently improved interpretability. Alternatively, this method can be used to estimate by trial and error the residual anti-symmetric aberrations in HRTEM images of weakly scattering objects. [ABSTRACT FROM AUTHOR]

This paper lists simple closed-form expressions estimating aberration coefficients (defocus, astigmatism, three-fold astigmatism, coma / misalignment, spherical aberration) on the basis of image shift or diffractogram shape measurements as a function of injected beam tilt. Simple estimators are given for a large number of injected tilt configurations, optimal in the sense of least-squares fitting of all the measurements, and so better than most reported previously. Standard errors are given for most, allowing different approaches to be compared. Special attention is given to the measurement of the spherical aberration, for which several simple procedures are given, and the effect of foreknowledge of this on other aberration estimates is noted. Details and optimal expressions are also given for a new and simple method of analysis, requiring measurements of the diffractogram mirror axis direction only, which are simpler to make than the focus and astigmatism measurements otherwise required. [ABSTRACT FROM AUTHOR]

Low-voltage High-Resolution Electron Microscopy (LVHREM) has several advantages, including increased cross-sections for inelastic and elastic scattering, increased contrast per electron, decreased delocalization effects and reduced knock-on damage. Imaging at differing voltages has shown advantages for imaging materials that are knock-on damage sensitive. We show experimentally that different materials systems benefit from low voltage high-resolution microscopy. There are advantages for imaging single layer materials such as graphene at below the knock-on threshold; we present an example of imaging a graphene sheet at 40 kV. We have also examined mesoporous silica decorated with Pd nanoparticles and carbon black functionalized with Pd/Pt nanoparticles. In these cases we show that the lower voltage imaging maintains the structure of the surrounding matrix during imaging, whereas aberration correction provides the higher resolution for imaging the nanoparticle lattice. Perhaps surprisingly we show that zeolites damage preferentially by ionization effects (radiolysis). The current literature suggests that below incident energies of 40 kV the damage is mainly radiolitic, whereas at incident energies above 200 kV the knock-on damage and material sputtering will be the dominant effect. Our experimental observations support this conclusion and the effects we have observed at 40 kV are not indicative of knock-on damage. Other nanoscale materials such as thin silicon nanowires also benefit from lower voltage imaging. LVHREM imaging provides an excellent option to avoid beam damage to nanowires; our results suggest that LVHREM is suitable for nanowire-biological composites. Our experimental observations serve as a clear demonstration that even at 40 keV accelerating voltage, LVHREM can be used without inducing beam damage to locate dislocations and other crystalline defects, which may have adverse effects on nanowire device performance. Low voltage operation will likely become the new mode of imaging for many electron microscopes, with the instrument being, in essence, tuned to extract all the information possible from each electron that transits the sample. [ABSTRACT FROM AUTHOR]

Abstract: High resolution electron microscopy has been applied to study the structure of metallic nanoparticles. These have sparked considerable interest as contrast agents in the field of biological imaging, including in magnetic resonance imaging (MRI) and computed tomography (CT). Here, we describe a method of synthesizing sub-10nm superparamagnetic metal and alloy nanoparticles by reduction of metallic salts. Annealing at 900°C in a methane/hydrogen environment forms a thin graphitic-carbon shell which is expected to improve stability, biocompatibility, and functionalization. Subsequent high resolution electron microscopy verifies graphitization and allows for crystallographic analysis. Most particles consist of single crystals in the phase predicted for the bulk material at the annealing temperature. Electron energy loss spectroscopy, energy dispersive X-ray spectroscopy and lattice constant measurements show large variation in composition for alloy nanoparticles from a single synthesis. The magnetization relaxation time (T2) measurements demonstrate that Fe and AuFe nanoparticles compete with commercially available iron oxide MRI contrast agents. X-ray attenuation measurements of an AuFe alloy nanoparticle solution gave a relative radiodensity of 280 Hounsfield Units, demonstrating promise as a dual-purpose contrast agent in CT and MRI. Long term stability in an atmospheric environment was also tested, with no signs of corrosion or oxidation after several years of storage. [Copyright &y& Elsevier]

Abstract: In situ high-resolution transmission electron microscopy (TEM) of solids under reactive gas conditions can be facilitated by microelectromechanical system devices called nanoreactors. These nanoreactors are windowed cells containing nanoliter volumes of gas at ambient pressures and elevated temperatures. However, due to the high spatial confinement of the reaction environment, traditional methods for measuring process parameters, such as the local temperature, are difficult to apply. To address this issue, we devise an electron energy loss spectroscopy (EELS) method that probes the local temperature of the reaction volume under inspection by the electron beam. The local gas density, as measured using quantitative EELS, is combined with the inherent relation between gas density and temperature, as described by the ideal gas law, to obtain the local temperature. Using this method we determined the temperature gradient in a nanoreactor in situ, while the average, global temperature was monitored by a traditional measurement of the electrical resistivity of the heater. The local gas temperatures had a maximum of 56°C deviation from the global heater values under the applied conditions. The local temperatures, obtained with the proposed method, are in good agreement with predictions from an analytical model. [Copyright &y& Elsevier]

Abstract: The concept of resolution in high-resolution electron microscopy (HREM) is the power to resolve neighboring atoms. Since the resolution is related to the width of the point spread function of the microscope, it could in principle be determined from the image of a point object. However, in electron microscopy there are no ideal point objects. The smallest object is an individual atom. If the width of an atom is much smaller than the resolution of the microscope, this atom can still be considered as a point object. As the resolution of the microscope enters the sub-Å regime, information about the microscope is strongly entangled with the information about the atoms in HREM images. Therefore, we need to find an alternative method to determine the resolution in an object-independent way. In this work we propose to use the image wave of a crystalline object in zone axis orientation. Under this condition, the atoms of a column act as small lenses so that the electron beam channels through the atom column periodically. Because of this focusing, the image wave of the column can be much more peaked than the constituting atoms and can thus be a much more sensitive probe to measure the resolution. Our approach is to use the peakiness of the image wave of the atom column to determine the resolution. We will show that the resolution can be directly linked to the total curvature of the atom column wave. Moreover, we can then directly obtain the resolution of the microscope given that the contribution from the object is known, which is related to the bounding energy of the atom. The method is applied on an experimental CaTiO3 image wave. [Copyright &y& Elsevier]

Abstract: High resolution electron backscattered diffraction (HREBSD) is a novel technique for a relative determination of both orientation and stress state in crystals through digital image correlation techniques. Recent works have tried to use simulated EBSD patterns as reference patterns to achieve the absolute orientation and stress state of crystals. However, a precise calibration of the pattern centre location is needed to avoid the occurrence of phantom stresses. A careful analysis of the projective transformation involved in the formation of EBSD patterns has permitted to understand these phantom stresses. This geometrical analysis has been confirmed by numerical simulations. The results indicate that certain combinations of crystal strain states and sample locations (pattern centre locations) lead to virtually identical EBSD patterns. This ambiguity makes the problem of solving the absolute stress state of a crystal unfeasible in a single-detector configuration. [Copyright &y& Elsevier]

Abstract: The effects of spatial and temporal averaging on high-resolution transmission electron microscope (HRTEM) images and associated intensity profiles of a solid–liquid Al interface were investigated using atomic coordinates obtained from molecular dynamics simulations. It was found that intensity profiles obtained by spatial averaging across the solid–liquid interface capture the variation in structural features nearly as well as time-averaged intensity profiles. This suggests that adequate spatial averaging of a single HRTEM image can be used to study the contrast from interfaces, and thereby, the structural details, without the need for more time-consuming, computer-intensive time averaged analyses. The limitations of this method are also discussed. [Copyright &y& Elsevier]

Abstract: In this paper, we investigate to what extent high resolution transmission electron microscopy images can be used to measure the mass, in terms of thickness, and surface profile, corresponding to the defocus offset, of an object at the atomic scale. Therefore, we derive an expression for the statistical precision with which these object parameters can be estimated in a quantitative analysis. Evaluating this expression as a function of the microscope settings allows us to derive the optimal microscope design. Acquiring three-dimensional structure information in terms of thickness turns out to be much more difficult than obtaining two-dimensional information on the projected atom column positions. The attainable precision is found to be more strongly affected by processes influencing the image contrast, such as phonon scattering, than by the specific choice of microscope settings. For a realistic incident electron dose, it is expected that atom columns can be distinguished with single atom sensitivity up to a thickness of the order of the extinction distance. A comparable thickness limit is determined to measure surface steps of one atom. An increase of the electron dose shifts the limiting thickness upward due to an increase in the signal-to-noise ratio. [Copyright &y& Elsevier]

Abstract: We have used a simple analytic model of iterative wave reconstruction from HRTEM focal series to derive reconstruction guidelines. We find that the reconstruction must be padded and that samples with varying thicknesses over the field of view can require a very large number of iterations to correctly converge. We also consider the effect of a detector modulation transfer function, noise and an incorrect estimate on focal plane spacing on iterative wave reconstruction. We have used multislice simulations in 1D and 2D and developed a high-speed, parallelized implementation of exit wave reconstruction to validate our analytic model and demonstrate why convergence is required for quantitative sample thickness measurements. [Copyright &y& Elsevier]

Abstract: The analysis of grain boundary structure in high resolution electron microscopy is often hindered by contrast variation within the grain boundary region which is not explained by simple models of the grain boundary structure. Recent work suggests that structural disorder along the beam direction and the presence of vacancies contribute significantly to this effect. One might expect a significant reduction in contrast in a Z-contrast image of a grain boundary would imply that vacancies present must result from the absence of heavier elements. Using a [001](210) grain boundary in SrTiO3 as a test case and first principles structure relaxation to calculate stable defect structures, we show that the reduction in the intensity from fully occupied Sr columns due to the structural distortion resulting from a nearby O vacancy can be as great as that due to introducing a Sr vacancy in the column itself. The effect on energy dispersive X-ray spectroscopy signals is also considered, but found to be smaller than that on Z-contrast images. [Copyright &y& Elsevier]

Abstract: In this paper, it has been investigated how to measure atom column positions as accurately and precisely as possible using a focal series of images. In theory, it is expected that the precision would considerably improve using a maximum likelihood estimator based on the full series of focal images. As such, the theoretical lower bound on the variances of the unknown atom column positions can be attained. However, this approach is numerically demanding. Therefore, maximum likelihood estimation has been compared with the results obtained by fitting a model to a reconstructed exit wave rather than to the full series of focal images. Hence, a real space model-based exit wave reconstruction technique based on the channelling theory is introduced. Simulations show that the reconstructed complex exit wave contains the same amount of information concerning the atom column positions as the full series of focal images. Only for thin samples, which act as weak phase objects, this information can be retrieved from the phase of the reconstructed complex exit wave. [Copyright &y& Elsevier]

Abstract: We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization. [Copyright &y& Elsevier]

Abstract: The lateral resolution of a surface sensitive low-energy electron microscope (LEEM) has been improved below 4nm for the first time. This breakthrough has only been possible by simultaneously correcting the unavoidable spherical and chromatic aberrations of the lens system. We present an experimental criterion to quantify the aberration correction and to optimize the electron optical system. The obtained lateral resolution of 2.6nm in LEEM enables the first surface sensitive, electron microscopic observation of the herringbone reconstruction on the Au(111) surface. [ABSTRACT FROM AUTHOR]

Abstract: Intrinsic spherical aberrations of electron lenses have been the major resolution limiting factor in electron microscopes for several decades. While effective correctors have recently been implemented, an alternative to correct these aberrations is to circumvent them by scaling down lens dimensions by several orders of magnitude. We have fabricated electrostatic lenses exhibiting one micrometer diameter apertures and evaluated their beam forming properties against predictions from numerical ray tracing simulations. It turns out that it is routinely possible to shape a paraxial low-energy electron beam by such micron-sized lenses. Beam profiles have been measured both at a distant detector as well as in a plane close to the lens. It is shown that the lens can form a parallel beam extending no more than 800nm from the optical axes at a distance of beyond the lens exit. We believe that these findings constitute a prerequisite to derive novel tools for high resolution microscopy using low-energy electrons. [ABSTRACT FROM AUTHOR]

Abstract: The direct object retrieval via the linearized inversion of the dynamical scattering matrix is extended using a second order perturbation theory and including mixed type potentials. The higher order perturbation increases the confidence region extracting object thickness and bending directly out of amplitude and phase of an electron wave without using trial-and-error iterative matching. Applying parameterization of a mixed type total scattering potential as a priori information enables a simple extension of the structure retrieval procedure to reconstruct local variations of the object potential, too. [Copyright &y& Elsevier]

Abstract: Recently designed advanced in-situ specimen holders for transmission electron microscopy (TEM) have been used in studies of gold nanoparticles. We report results of variable temperature TEM experiments in which structural transformations have been correlated with specimen temperature, allowing general trends to be identified. Transformation to a decahedral morphology for particles in the size range 5–12nm was observed for the majority of particles regardless of their initial structure. Following in-situ annealing, decahedra were found to be stable at room temperature, confirming this as the equilibrium morphology, in agreement with recently calculated phase diagrams. Other transitions at low temperature in addition to surface roughening have also been observed and correlated with the same nanoscale phase diagram. Investigations of gold particles at high temperature have revealed evidence for co-existing solid and liquid phases. Overall, these results are important in a more precise understanding of the structure and action of catalytic gold nanoparticles and in the experimental verification of theoretical calculations. [Copyright &y& Elsevier]

Abstract: The projected electrostatic potential is reconstructed from a high-resolution exit wave function through a maximum-likelihood refinement algorithm. The theory of an already existing algorithm is extended to include the effects of phenomenological absorption. Various tests with a simulated exit wave function of YBa2Cu3O7 in [100] orientation used as a source show that the reconstruction is successful, regardless of the strongly differing scattering power of atomic columns, even for the case of strong dynamical diffraction. Object thickness, the amount of absorption, and a residual defocus aberration of the wave function—parameters often unknown or difficult to measure in experiments—can be determined accurately with the aid of the refinement algorithm in a self-consistent way. For the next generation of instruments, with information limits of 0.05nm and better, reconstruction accuracies of better than 2% can be expected, which is sufficient to measure and display the structural and chemical information with the aid of an accurate projected potential map. [Copyright &y& Elsevier]

Abstract: Employing an aberration corrector in a high-resolution transmission electron microscope, the spherical aberration C S can be tuned to negative values, resulting in a novel imaging technique, which is called the negative C S imaging (NCSI) technique. The image contrast obtained with the NCSI technique is compared quantitatively with the image contrast formed with the traditional positive C S imaging (PCSI) technique. For the case of thin objects negative C S images are superior to positive C S images concerning the magnitude of the obtained contrast, which is due to constructive rather than destructive superposition of fundamental contrast contributions. As a consequence, the image signal obtained with a negative spherical aberration is significantly more robust against noise caused by amorphous surface layers, resulting in a measurement precision of atomic positions which is by a factor of 2–3 better at an identical noise level. The quantitative comparison of the two alternative C S-corrected imaging modes shows that the NCSI mode yields significantly more precise results in quantitative high-resolution transmission electron microscopy of thin objects than the traditional PCSI mode. [Copyright &y& Elsevier]

Abstract: The displacement field of the metal sub-lattice in homologous compounds In2O3(ZnO) m is investigated by means of aberration-corrected high-resolution transmission electron microscopy. The elastic state in these compounds is characterised by plane strain where little column bending occurs due to surface relaxation. The compound contains inversion domain boundaries (IDBs) on basal and pyramidal planes of ZnO where the displacements are concentrated. The structure is imaged in <11¯00> of ZnO with negative spherical aberration and using bright atom contrast condition. Local atomic shifts are measured with precision of ca. 5 picometres in real space with a peak finding algorithm. The strain tensor and lattice rotations are calculated from displacements displaying dilatation, shear and rotation at pyramidal IDBs which reveal a mirror plane through the centre of each inversion domain. [Copyright &y& Elsevier]

Abstract: The system exhibits a strained ZnO-like domain structure intersected by indium containing, parallely arranged defect planes with a regular spacing of about 2.4nm. We propose that the strain within the domains originates from long-range electric fields due to charge localization at the defects inducing ionic displacements. The origin of the electric fields has been investigated theoretically by means of density functional theory (DFT). Calculated electric fields were incorporated as scattering potentials in holographic imaging simulations. Since the exact structure of the system is unknown, a novel structure model was derived for from known members of the homologous series of with and refined by structure optimization at DFT level. The theoretical results are compared to experimental findings in high-resolution phase images obtained by means of electron holography, which suggest residual intrinsic electric fields. A careful consideration of noise levels and the influence of the microscope, however, show that the electric field signal is at the detection limit of state-of-the-art high-resolution electron holography. [Copyright &y& Elsevier]

Abstract: A new electron diffraction microscope based on a conventional scanning electron microscope (SEM), for obtaining atomic-level resolution images without causing serious damage to the specimen, has been developed. This microscope in the relatively low-voltage region makes it possible to observe specimens at suitable resolution and record diffraction patterns. Using the microscope we accomplished 10-kV diffractive imaging with the iterative phase retrieval and reconstructed the structure of a multi-wall carbon nanotube with its finest feature corresponding to 0.34-nm carbon wall spacing. These results demonstrate the possibility of seamless connection between observing specimens by SEM and obtaining their images at high resolution by diffractive imaging. [Copyright &y& Elsevier]

Abstract: In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, quasicrystals, grain boundaries, nanoparticles or arbitrary objects provided the coordinates of all the atoms can be supplied. [Copyright &y& Elsevier]

Abstract: Transmission electron microscopy typically works with highly accelerated thus relativistic electrons. Consequently the scattering process is described within a relativistic formalism. In the following, we will examine three different relativistic formalisms for elastic electron scattering: Dirac, Klein-Gordon and approximated Klein-Gordon, the standard approach. This corresponds to a different consideration of spin effects and a different coupling to electromagnetic potentials. A detailed comparison is conducted by means of explicit numerical calculations. For this purpose two different formalisms have been applied to the approaches above: a numerical integration with predefined boundary conditions and the multislice algorithm, a standard procedure for such simulations. The results show a negligibly small difference between the different relativistic equations in the vicinity of electromagnetic potentials, prevailing in the electron microscope. The differences between the two numeric approaches are found to be small for small-angle scattering but eventually grow large for large-angle scattering, recorded for instance in high-angle annular dark field. [Copyright &y& Elsevier]

Abstract: The concern of this work is the influence of the thermal motion of the atoms on electron scattering simulations, used for quantitative interpretation of results in high-resolution electron microscopy. We distinguish between the influence of inelastic phonon excitation and the effect of a moving lattice on images generated by elastically scattered electrons. It is shown that, analog to aberrations, the impact of a moving lattice differs substantially with respect to different imaging conditions and cannot be described by the Debye–Waller damping applicable in XRD. We derive a new formalism, based on the frozen lattice and multislice approach, to incorporate the statistics of the thermal motion into elastic TEM imaging simulations, taking into account different imaging conditions. The averaging over different atom positions is generally performed within a density matrix framework, which can be linearized in the special case of off-axis electron holography. All findings are supported by explicit numerical simulations: molecular dynamics simulations are performed to get a realistic thermal motion and the electron scattering simulations are performed within the new multislice algorithm. [Copyright &y& Elsevier]

Abstract: Atomic force microscopy (AFM) enables high-resolution three-dimensional (3D) imaging of cultured bone marrow-derived mast cells. Cells were immobilized by a quick centrifugation and fixation to preserve their transient cellular morphologies followed by AFM characterization in buffer. This “fix-and-look” approach preserves the structural integrity of individual cells. Well-known membrane morphologies, such as ridges and microvilli, are visualized, consistent with prior electron microscopy observations. Additional information including the 3D measurements of these characteristic features are attained from AFM topographs. Filopodia and lamellopodia, associated with cell spreading, were captured and visualized in three dimensions. New morphologies are also revealed, such as high-density ridges and micro-craters. This investigation demonstrates that the “fix-and-look” approach followed by AFM imaging provides an effective means to characterize the membrane structure of hydrated cells with high resolution. The quantitative imaging and measurements pave the way for systematic correlation of membrane structural features with the biological status of individual cells. [Copyright &y& Elsevier]

Abstract: It is challenging to prepare a good sample for high-resolution electron microscopy of polycrystalline ceramic powders containing hard particles or particles with a strong preferential cleavage. Here we demonstrate that embedding the particles in a Cu matrix in a pressed pellet allows for straightforward conventional ion milling. The method is applied to powders of Mg10Ir19B16 and Na0.5CoO2 to show its feasibility, whereby transmission electron microscopy (TEM) samples with crystalline areas thinner than 10nm can be obtained easily. [Copyright &y& Elsevier]

Abstract: Thermal diffuse scattered electrons significantly contribute to high-resolution transmission electron microscopy images. Their intensity adds to the background and is peaked at positions of atomic columns. In this paper we suggest an approximation to simulate intensity of thermal diffuse scattered electrons in plane-wave illumination transmission electron microscopy using an emission-potential multislice algorithm which is computationally less intensive than the frozen lattice approximation or the mutual intensity approach. Intensity patterns are computed for Au and InSb for different crystal orientations. These results are compared with intensities from the frozen lattice approximation based on uncorrelated vibration of atoms as well as with the frozen phonon approximation for Au. The frozen phonon method uses a detailed phonon model based on force constants we computed by a density functional theory approach. The comparison shows that our suggested emission-potential method is in close agreement with both the frozen lattice and the frozen phonon approximations. [Copyright &y& Elsevier]

Abstract: Cubic boron nitride (c-BN) nucleation takes place on hexagonal boron nitride (h-BN) layers growing perpendicular to the substrate surface during thin film synthesis. Studies focused on the nucleation of the cubic phase suggest the possibility that transient phases and/or defects on these h-BN structures have a role in sp3-bonded cubic phase nucleation. In this study, we have investigated the nature, energetics, and structure of several possible defects on BN basal planes, including point defects, 4-, and 5-fold BN rings, that may possibly match the experimentally observed transient phase fine structure. TEM image observations are used to build approximate atomic models for the proposed structures, and DFT calculations are used to relax these structures while minimizing their respective total energies. These optimized atomic geometries are then used to simulate TEM images, which are compared to the experimentally observed structures. Data from DFT calculations and analysis of simulated images from the proposed atomic structures suggest that 4-fold BN rings are more likely to exist on the transient phase possibly leading to c-BN nucleation. [Copyright &y& Elsevier]

Abstract: In many cases nanostructures present forbidden spots in their electron diffraction patterns when they are observed by transmission electron microscopy (TEM). To interpretate their TEM and high resolution transmission electron microscopy (HRTEM) images properly, an understanding of the origin of these spots is necessary. In this work we comment on the origin of the forbidden spots observed in the [111] and [112] electron diffraction patterns of flat gold triangular nanoparticles. The forbidden spots were successfully indexed as corresponding to the first laue Zone (FOLZ) and the HRTEM images presented a contrast produced by the interference of the zero-order Laue zone (ZOLZ) and FOLZ spots. We discuss the use of the forbidden spots in the study of the structure of nanoparticles and show that they are related to the shape and incompleteness of layers in the very thin particles. [Copyright &y& Elsevier]

Abstract: High resolution imaging of intracellular structures of ultrathin cell section samples is critical to the performance of precise manipulation by atomic force microscopy (AFM). Here, we test the effect of multiple factors during section sample preparation on the quality of the AFM image. These factors include the embedding materials, the annealing process of the specimen block, section thickness, and section side. We found that neither the embedding materials nor the temperature and speed of the annealing process has any effect on AFM image resolution. However, the section thickness and section side significantly affect the surface topography and AFM image resolution. By systematically testing the image quality of both sides of cell sections over a wide range of thickness (40–1000nm), we found that the best resolution was obtained with upper-side sections approximately 50–100nm thick. With these samples, we could observe precise structure details of the cell, including its membrane, nucleoli, and other organelles. Similar results were obtained for other cell types, including Tca8113, C6, and ECV-304. In brief, by optimizing the condition of ultrathin cell section preparation, we were able to obtain high resolution intracellular AFM images, which provide an essential basis for further AFM manipulation. [Copyright &y& Elsevier]

Abstract: Details of the local structure of a complex tungsten bronze, have been determined using focal series exit wave reconstruction. Octahedral rotations in different structural regions of the same crystal have been directly measured from the exit wave phase and correlated with variations in cation occupancy determined from the exit wave modulus. [Copyright &y& Elsevier]

Abstract: We investigate the effects of local charge defects in HREM imaging, using electron densities calculated by density functional methods. As a model of a planar interface with a local charge defect we use the polar MgO (111)− R30° surface, which has an additional hole per surface unit cell. A complimentary example, the non-polar MgO (100) surface that has no local charge defect is simulated for comparison. We show that the contrast due to local charge defects is rather high, and suggest that they should be directly observable. [Copyright &y& Elsevier]

Abstract: Magnetic AC mode (MAC mode) atomic force microscopy (AFM), a novel type of tapping mode AFM in which the cantilever is driven directly by a magnetic field, is a powerful tool for imaging with high spatial resolution and better signal-to-noise in liquid environment. It may largely extend the application of AFM to living samples, especially those are sensitive to cantilever forces, even to multilayer tissue samples. However, there are few reports on the imaging of living cells by MAC mode AFM previously. In our present study, we explore the optimal imaging conditions of MAC mode AFM on living astrocytes and fresh arterial intima surface. We also used nude tips for PicoTREC panel (i.e., Aux in BNC, a new data collecting channel) to image living samples and discussed its difference with phase imaging. We show that living biological samples can be imaged by MAC mode AFM at details of comparable resolution as those by high resolution scanning electron microscopy. Furthermore, the combination of height, amplitude, phase and TREC panel signals provide abundant informations for the characteristics of living samples, such as topography, profile, stiffness and adhesion. [Copyright &y& Elsevier]

Abstract: This paper is the second part of a two-part paper on maximum likelihood (ML) estimation of structure parameters from electron microscopy images. In order to show the practical applicability of the theoretical methods described in the first part of this two-part paper, an experimental study of an aluminium crystal is presented. In this study, structure parameters, atom column distances in particular, are estimated from high-resolution transmission electron microscopy (HRTEM) images using the ML method. The necessary steps to be made in the application of this method will be worked out one by one, including model assessment, the computation of the ML parameter estimates, and the construction of confidence intervals for these parameter estimates. [Copyright &y& Elsevier]

Abstract: This paper is the first part of a two-part paper on maximum likelihood (ML) estimation of structure parameters from electron microscopy images. In principle, electron microscopy allows structure determination with a precision that is orders of magnitude better than the resolution of the microscope. This requires, however, a quantitative, model-based method. In our opinion, the ML method is the most appropriate one since it has optimal statistical properties. This paper aims to provide microscopists with the necessary tools to apply this method so as to determine structure parameters as precisely as possible. It reviews the theoretical framework, including model assessment, the derivation of the ML estimator of the parameters, the limits to precision and the construction of confidence regions and intervals for ML parameter estimates. In a companion paper [Van Aert et al., Ultramicroscopy, this issue, 2005], a practical example will be worked out. [Copyright &y& Elsevier]

The core structure of a dislocation complex in SiGe/Si system composed of a perfect 60° dislocation and an extended 60° dislocation has been revealed at atomic level. This is attained by applying the image deconvolution technique in combination with dynamical diffraction effect correction to an image taken with a 200 kV field-emission high-resolution electron microscope. The possible configuration of the dislocation complex is analyzed and their Burgers vectors are determined. [Copyright &y& Elsevier]

Apparent growth of amorphous layers during low temperature annealing was observed in low energy Ge+-implanted (0 0 1)Si by high-resolution transmission electron microscopy. The occurrence of abnormal growth is due to the randomization of heavily damaged regions beneath the original amorphous/crystalline interfaces. The randomization process is attributed to the strain, incurred by the presence of a high density of large Ge atoms in the heavily damaged Si substrate, relaxation to lower the free energy of the systems. The randomization upon annealing may be fruitfully applied to minimize the transient enhanced diffusion in shallow junction formation. [Copyright &y& Elsevier]

Microstructures of the RuSr2Gd1.5Ce0.5Cu2O10−δ (Ru-1222) and RuSr2GdCu2O8 (Ru-1212) magneto-superconductors have been investigated by using selected-area electron diffraction, convergent-beam electron diffraction, dark-field electron microscopy and high-resolution electron microscopy at room temperature. Both Ru-1212 and Ru-1222 consist of nm-size domains stacked along the c direction, where the domains are formed by two types of superstructures due to ordering of rotated RuO6 octahedra about the c-axis. In Ru-1212, both primitive-and body-centered tetragonal superstructures (the possible space groups: P4/mbm and I4/mcm) are derived to form the corresponding nm-domains. It is of great interest that Ru-1212 consists of domains of two crystallographically different superstructures, while the similar domains observed in Ru-1222 have crystallographically identical superstructure with an orthorhombic symmetry (possible space group: Aeam), related by 90° rotation around the c-axis (Yokosawa et al., 2003, submitted for publication). [Copyright &y& Elsevier]

High-resolution electron energy-loss spectroscopy in a transmission electron microscope is a very powerful method for the study of electronic structure of materials. The fine structure of Ga L2,3 and N ionization edges in c-GaN and h-GaN was studied using a TEM equipped with a monochromator and high-resolution energy spectrometer. The experimental results were compared with the results of calculation based on the density functional theory using the Wien2k code and show that the best fit is achieved when the core hole effect is taken into account. The effect of the core hole value and the supercell size on the energy-loss near-edge structure have been investigated. A different behaviour was found for c-GaN and h-GaN: better agreement is obtained for a 0.5 core hole for h-GaN and for a full core hole for c-GaN. The anisotropic behaviour of the experimental spectra and calculated spectra for h-GaN have been studied and the “magic” angle was determined. [Copyright &y& Elsevier]

Nanocrystallization during deformation of metallic glass at room temperature has significant implications to understand its deformation mechanism. We present here direct high-resolution transmission electron microscopy (HRTEM) observations of nanocrystallization in a Zr55AI10Ni5Cu30 bulk metallic glass (BMG) fractured by uniaxial compression at room temperature. The formed nanocrystallites are Zr2Cu, with the average diameter of less than 10 nm, and are distributed within the round-like regions of localized plastic deformation. We also show direct evidence of atomic neighbor distance increases associated with the shrinkage and broadening of diffused ring pattern from local deformed areas, which may enhance atomic mobility so that nanocrystallization occurred. Our results demonstrate that the origin of the room-temperature deformation of BMG can be attributed to the local atomic spacing increases induced by localization of plastic flow under uniaxial compression test. [Copyright &y& Elsevier]

The contribution of electrons that have been phonon scattered to the lattice fringe amplitude and the background intensity of a high-resolution electron microscope (HREM) image is addressed experimentally through the analysis of a defocus series of energy-filtered off-axis electron holograms. It is shown that at a typical specimen thickness used for HREM imaging approximately 15% of the electrons that contribute to an energy-filtered image have been phonon scattered. At this specimen thickness, the phonon-scattered electrons contribute a lattice image of opposite contrast to the elastic lattice image. The overall lattice fringe contrast is then reduced to 70% of the value that it would have in the absence of phonon scattering. At higher specimen thickness, the behaviour is defocus-dependent, with the phonon image having lattice fringe contrast of either the same or the opposite sense to the elastic image as the defocus is varied. [Copyright &y& Elsevier]

Direct methods in real and reciprocal space are developed for structural reversion. The direct method in real space involves the use of a novel method to retrieve the phase in the image plane using transport of intensity equation/maximum entropy method (TIE/MEM) and exit wave reconstruction by self-consistent propagation. Since the exit wave is restored from the complex signal in the image planes, no image model between the exit wave and image is assumed. The structural information in the reconstructed exit wave is then further extended by a “complex” maximum entropy method as a direct method in reciprocal space to extrapolate the phase to higher frequencies. [Copyright &y& Elsevier]