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Your search keyword '"Turkka O. Tuomi"' showing total 2 results

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2 results on '"Turkka O. Tuomi"'

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1. Synchrotron X-ray diffraction topography study of bonding-induced strain in silicon-on-insulator wafers

2. Evaluation of critical thickness of GaP0.98N0.02 layer on GaP substrate by synchrotron X-ray diffraction topography

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