Author: "Jackman J.A." / Journal: thin solid films - Searchworks@Jio Institute Digital Library Search Results

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1. Determination of the depth distribution of carriers in silicon molecular beam epitaxially grown material by electrochemical capacitance-voltage measurements

Author: Kechang, Song, primary, Baribeau, J.-M., additional, Houghton, D.C., additional, and Jackman, J.A., additional
Published: 1990
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