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43. Charging effects and surface potential variations of Cu-based nanowires

Author

Suman Nandy, Tomás Calmeiro, Pedro Barquinha, John C. Walmsley, Ana Pimentel, Elvira Fortunato, Patricia Almeida Carvalho, Daniela Nunes, Rodrigo Martins, and Joana V. Pinto

Subjects
Kelvin probe force microscope, Materials science, Scanning electron microscope, Band gap, Electrostatic force microscope, Metals and Alloys, Analytical chemistry, Nanowire, Oxide, 02 engineering and technology, Surfaces and Interfaces, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Transmission electron microscopy, Microscopy, Materials Chemistry, 0210 nano-technology
Abstract

The present work reports charging effects and surface potential variations in pure copper, cuprous oxide and cupric oxide nanowires observed by electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM). The copper nanowires were produced by wet synthesis, oxidation into cuprous oxide nanowires was achieved through microwave irradiation and cupric oxide nanowires were obtained via furnace annealing in atmospheric conditions. Structural characterization of the nanowires was carried out by X-ray diffraction, scanning electron microscopy, transmission electron microscopy and energy dispersive X-ray spectroscopy. During the EFM experiments the electrostatic field of the positive probe charged negatively the Cu-based nanowires, which in turn polarized the SiO2 dielectric substrate. Both the probe/nanowire capacitance as well as the substrate polarization increased with the applied bias. Cu2O and CuO nanowires behaved distinctively during the EFM measurements in accordance with their band gap energies. The work functions (WF) of the Cu-based nanowires, obtained by KPFM measurements, yielded WFCuO > WFCu > WFCu2O.

Published
2016

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