1. X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility
- Author
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J. E. Ducret, F. Thais, G. Soullié, F. Gilleron, V. Silvert, Charles Reverdin, Guillaume Loisel, B. Villette, Sylvaine Turck-Chièze, Jean-Christophe Pain, T. Caillaud, M. Poirier, W. Foelsner, D. Gilles, Thomas Blenski, S. Bastiani-Ceccotti, M. Busquet, and F. Serres
- Subjects
Physics ,Spectrometer ,Opacity ,business.industry ,Streak camera ,Grating ,Laser ,law.invention ,Optics ,law ,Atomic number ,Spectral resolution ,Atomic physics ,business ,Instrumentation ,Diffraction grating - Abstract
An x-ray grating spectrometer was built in order to measure opacities in the 50 eV to 250 eV spectral range with an average spectral resolution ⟨E/δE⟩ ∼ 50. It has been used at the LULI-2000 laser facility at Ecole Polytechnique (France) to measure the Δn = 0, n = 3 transitions of several elements with neighboring atomic number: Cr, Fe, Ni, and Cu in the same experimental conditions. Hence a spectrometer with a wide spectral range is required. This spectrometer features one line of sight looking through a heated sample at backlighter emission. It is outfitted with one toroidal condensing mirror and several flat mirrors cutting off higher energy photons. The spectral dispersion is obtained with a flatfield grating. Detection consists of a streak camera sensitive to soft x-ray radiation. Some experimental results showing the performance of this spectrometer are presented.
- Published
- 2012