1. Direct Current Conductivity of Thin-Film Ionic Conductors from Analysis of Dielectric Spectroscopic Measurements in Time and Frequency Domains
- Author
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Christos Pandis, Konstantinos Beltsios, Panagiotis Argitis, Stella Kennou, Polycarpos Pissis, Antonios M. Douvas, Panagiotis Dimitrakis, E. Kapetanakis, Vassilios Saltas, Pascal Normand, Paschalis Gkoupidenis, and Apostolos Kyritsis
- Subjects
Materials science ,Direct current ,Analytical chemistry ,Ionic bonding ,02 engineering and technology ,Dielectric ,Conductivity ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,0104 chemical sciences ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Dielectric spectroscopy ,law.invention ,Capacitor ,General Energy ,law ,Physical and Theoretical Chemistry ,Thin film ,0210 nano-technology ,Electrical conductor - Abstract
A method is developed for extracting the direct current conductivity (σdc) of ion-conducting materials from frequency- and time-domain dielectric spectroscopy measurements. This method exploits the electrode polarization effects arising from the charging of an ion-blocking capacitor and provides a useful way of obtaining σdc for ionic conductors that do not exhibit a frequency- (time-) independent conductivity plateau; the latter absence of plateau is often encountered in the case of thin-film materials. It allows, by proper design of the test cells, the estimation of σdc independently of the specimen thickness, as demonstrated herein for SiO2 blocking layers and electrolyte systems made of a polyoxometalate (POM) molecule embedded in poly(methyl methacrylate) (PMMA) polymeric matrices. For different postpreparation and measurement conditions, the σdc values obtained for thick (8 μm) POM–PMMA layers are in good agreement not only with the observed conductivity plateaus but also with the values determined ...
- Published
- 2016