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Eagle XG® glass is widely used in the manufacture of electronic displays. Spectroscopic ellipsometry and transmission data for this material were obtained from 193 to 1690 nm. The optical constants of the material were then modeled from 230 to 1690 nm. The data were initially fit with a basis spline (B-spline), and these results were used as the starting point for either a two-Gaussian oscillator model or a Tauc-Lorentz (T-L) + Gaussian oscillator model. Both models gave good fits, with unweighted mean squared error values of ca. 1.1. Samples were provided by Corning Incorporated directly from their production facility.

Three thicknesses of reactively sputtered SiO2, nominally 20, 40, and 60 nm, deposited on Corning Eagle XG® (EXG), an important display glass, were analyzed by spectroscopic ellipsometry. Reflection ellipsometry data from the samples were analyzed from 196 to 1688 nm at angles of 55°–60°, inclusive, in 1° increments. These angles were chosen because they bracket the Brewster angles of both EXG glass and SiO2. The backsides of the samples were roughened by sand blasting to suppress backside reflections from the substrates. A total of nine datasets were collected from nine different samples (three for each nominal thickness of SiO2), each at six different angles of incidence (54 spectra). The optical constants for each thickness of SiO2 was determined, as well as a set of constants for all the films (the material in general) via a multisample analysis (MSA). The optical constants of the SiO2 films were modeled using two poles with transparency assumed over the entire spectral range (a Sellmeier model). A Br...