13 results on '"Kusaka, M"'
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2. Interfacial reaction study of thermally annealed Ti film on 4H-SiC by soft X-ray emission spectroscopy
3. Study of the reaction at Cu/3C–SiC interface
4. Structural analysis of the heat-treated 4H(6H)-SiC(0001)Si surface
5. Study of the system using soft X-rays
6. Nonmetal to metal phase transition in the Mn/Si(111) 7 × 7 system
7. Electrical properties of p-type GaP schottky barrier under stress
8. Piezoelectric effect in AuCdS Schottky barrier
9. Electrical properties of interface between metal and III–V semiconductor under mechanical stress
10. Electrical properties of metal-piezoelectric semiconductor interface under stress
11. Interface properties and Schottky barriers on polar surfaces of CdS
12. A new application of soft X-ray spectroscopy to a non-destructive analysis of a film/substrate contact system: Carbonized-layer (ultra-thin-film)/Si(100)
13. Study of the [formula omitted] system using soft X-rays
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