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Start Over Author "Sanz, J." Journal surface and interface analysis
41 results on '"Sanz, J."'

28. Quantitative analysis of low‐energy N2+implantation in TiC using XPS and TRIM

Author

Fuentes, G. G., Elizalde, E., and Sanz, J. M.

Abstract

We have studied the implantation of 2 keV N2+ions in TiC. Both the shape and binding energy of the different core levels, as well as their modification, have been analysed during the implantation process. In order to quantify the implantation steps as a function of the N2+dose, we have used a Monte‐Carlo‐based TRIM code to simulate the implantation profile of the nitrogen ions, except for the absolute atomic concentration, which is then determined by making use of the usual equations for quantitative XPS.

Published
2002
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29. Electron inelastic mean free path for Ti, TiC, TiN and TiO2as determined by quantitative reflection electron energy‐loss spectroscopy

Author

Fuentes, G. G., Elizalde, E., Yubero, F., and Sanz, J. M.

Abstract

Electron inelastic mean free paths (IMFP) have been estimated for Ti, TiC, TiN and TiO2for energies between 250 and 2000 eV. The IMFP values have been derived from the respective energy‐loss function (i.e. Im{−1/ϵ}) on the basis of the model developed by Yubero and Tougaard for quantitative analysis using reflection electron energy‐loss spectra (REELS). The IMFPs have been analysed in terms of the Bethe equation for inelastic scattering and compared with the values predicted by the TPP‐2M equation. We have distinguished between λREELS(E0) and λ∞(E0), whereby the first takes into account surface effects as they appear in REELS experiments and λ∞(E0) is the value that is approached when the surface is ignored. The IMFPs determined here are observed to decrease in the order Ti > TiN ∼ TiC > TiO2as the density of valence electrons contributing to inelastic scattering processes increases. Furthermore, we observe a general good agreement with those values predicted by the TPP‐2M formulae, except for TiO2for which differences of up to 30–40% have been observed. Copyright © 2002 John Wiley & Sons, Ltd.

Published
2002
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30. Study of the growth of ultrathin films of NiO on Cu(111)

Author

Sánchez‐Agudo, M., Yubero, F., Fuentes, G. G., Gutiérrez, A., Sacchi, M., Soriano, L., and Sanz, J. M.

Abstract

We have studied the early stages of growth of the layers formed by Ni evaporation in an oxygen atmosphere at room temperature on a Cu(111) single crystal. The layers have been analysed by XPS and x‐ray absorption spectroscopy as a function of the deposition time. A background analysis of the XPS spectra has also been performed. We have found a Stranski–Krastanov way of growth, i.e. the formation of a metallic Ni monolayer followed by the formation of defective NiO islands. Further deposition leads to the formation of stoichiometric NiO. Copyright © 2000 John Wiley & Sons, Ltd.

Published
2000
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31. Friction measurements of CNxand TiCxNyfilms by scanning force microscopy

Author

Morant, C., Fernández, L. A., Quirós, C., Fuentes, G. G., Elizalde, E., and Sanz, J. M.

Abstract

Coatings of CNxand TiCxNyare of great technological interest because of their potential for use as hard and wear‐resistant coatings. In this work, CNxand TiCxNyfilms have been grown on Si(100) substrates in a dual ion beam sputtering (DIBS) system with different experimental conditions. The films were characterized by XPS and AES depth profiles in order to determine their surface stoichiometry, in addition to the in‐depth distribution of the components and contaminants in the film and at the interface. However, the main goal of this work was the study of the morphology and friction properties of these films using scanning force microscopy. Comparative analysis between the CNxand TiCxNyfilms and an amorphous carbon sample used as a reference indicates the good tribological properties of these films. A correlation between the N/C ratio and the friction coefficient was determined. In general, the FFvs. FNcurves show a 2/3 potential dependence for low loads followed by a linear dependence at high loads. The power law indicates that single asperity geometry should be assumed. Copyright © 2000 John Wiley & Sons, Ltd.

Published
2000
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32. Combination of specular and off-specular low-angle x-ray diffraction in the study of Co/Cu multilayers: mesoscopic structure and layer oxidation

Author

Bernabé, A. de, Capitán, M. J., Fischer, H. E., Quirós, C., Prieto, C., Colino, J., Mompeán, F., and Sanz, J. M.

Abstract

The use of resonant low-angle x-ray diffraction, combining specular and off-specular scans, has been used to characterize accurately and self-consistently a set of magnetron-sputtered Co/Cu multilayers. This study has permitted their mesoscopic structure and quality of interfaces to be determined. Moreover, it has been observed that oxidation of the outer Co layer stops at the Co/Cu interface, whence no Cu oxide is produced. The cause of this is explained by the difference in the Fermi energies between Co and Cu. © 1999 John Wiley & Sons, Ltd.

Published
1999

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