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A wavelength dispersive X-ray spectrometer is designed and developed for X-ray fluorescence analysis and spectroscopy using an X-ray microprobe at SPring‐8 BL39XU. The spectrometer uses a flat analyzer crystal, and X-rays from a small beam spot are dispersed by the crystal onto a position sensitive proportional counter. The energy resolution of the spectrometer is determined by the spatial resolution of the position sensitive proportional counter, and the additional use of the slit-scan can improve the energy resolution if necessary. Performance of the spectrometer is evaluated by using a conventional X-ray source, and preliminary experimental results of the X-ray microprobe by using brilliant hard X-rays from an X-ray undulator are reported. q 1999 Elsevier Science B.V. All rights reserved.

Tungsten (W) M III X-ray absorption spectra of a periodic multilayer, (Si/W) 100 /Si, were measured with the change of X-ray grazing angle using sample current method. Under not total reflection condition, the absorbance changed little except at W M III absorption edge. While under the total reflection condition, the absorbance increased with the increase of the X-ray energy and the increment changed from low to high at the W M III absorption edge. This result reflected the variation of the X-ray evanescent wavelength caused by the absorption effect of W.

Sulfur X-ray photoelectron spectra (XPS) and X-ray absorption spectra (XAS) of an aerosol sample collected by an Andersen sampler were measured using a synchrotron beam line. While the XPS was more surface sensitive than XAS, the detection limit of XAS was better than that of XPS. It was concluded that the XAS was more suitable for the chemical state analysis of sulfur in aerosol samples than XPS.