12 results on '"Ionica, I."'
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2. A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development
3. Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET
4. Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field
5. Back-gated InGaAs-on-insulator lateral N+NN+ MOSFET: Fabrication and typical conduction mechanisms
6. Low-frequency noise in bare SOI wafers: Experiments and model
7. Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers
8. Parasitic bipolar effect in ultra-thin FD SOI MOSFETs
9. A new characterization technique for SOI wafers: Split C(V) in pseudo-MOSFET configuration
10. Characterization of heavily doped SOI wafers under pseudo-MOSFET configuration
11. Field effect and Coulomb blockade in silicon on insulator nanostructures fabricated by atomic force microscope
12. Methodology for parameters extraction with undoped junctionless EZ-FETs.
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