13 results on '"Cheng, H.C."'
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2. Degradation of passivated and non-passivated N-channel low-temperature polycrystalline silicon TFTs prepared by excimer laser processing
3. Low-dielectric constant FLARE 2.0 films for bottom antireflective coating layers in KrF lithography
4. W ohmic contact for highly doped n-type GaN films
5. Reduction of boron penetration for a p+ polycide gate by using cobalt silicides as a boron diffusion source
6. A new analytical expression for the interface index of metal-Schottky contacts on semiconductors
7. Silicide-caused anomalous reverse current-voltage characteristics of CoSi2 shallow p+n junctions
8. Formation of self-aligned TiSi2p+−n junctions by implanting BF2+ ions through thin Ti or SiO2 film on Si substrate rapid thermal annealing
9. Characterization of silicided shallow n+p junctions formed by P+ implantation into thin Ti films on Si substrates
10. Novel effects of heating rate on the activation/recrystallization of boron-implanted Si substrates
11. Formation of shallow p+n junctions by implanting BF2− ions into thin cobalt films on silicon substrates
12. Excellent thermal stability of cobaltaluminum alloy Schottky contacts on GaAs substrates
13. The effect of gate electrodes using tungsten silicides and/or poly-silicon on the dielectric characteristics of very thin oxides
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