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Your search keyword '"Département Electronique et Physique (TSP - EPH)"' showing total 2 results
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2 results on '"Département Electronique et Physique (TSP - EPH)"'

1. Shear thickening of Laponite suspensions with poly (ethylene oxide)

Author

Abdoulaye Fall, Daniel Bonn, Fall, Abdoulaye, Département Electronique et Physique (EPH), Institut Mines-Télécom [Paris] (IMT)-Télécom SudParis (TSP), Laboratoire de Physique Statistique de l'ENS (LPS), Université Paris Diderot - Paris 7 (UPD7)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)-Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Soft Matter (WZI, IoP, FNWI), Département Electronique et Physique (TSP - EPH), Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS-PSL), and Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS]Physics [physics], chemistry.chemical_classification, Dilatant, Materials science, Oxide, General Chemistry, Polymer, Polyethylene oxide, Condensed Matter Physics, [PHYS] Physics [physics], [PHYS.COND.CM-SCM] Physics [physics]/Condensed Matter [cond-mat]/Soft Condensed Matter [cond-mat.soft], chemistry.chemical_compound, chemistry, Rheology, Shear (geology), [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], Composite material, [PHYS.COND.CM-SCM]Physics [physics]/Condensed Matter [cond-mat]/Soft Condensed Matter [cond-mat.soft], ComputingMilieux_MISCELLANEOUS, [PHYS.COND] Physics [physics]/Condensed Matter [cond-mat], Poly ethylene
Abstract

We study the effect of addition of polyethylene oxide (PEO) on the rheological behavior of suspensions of Laponite. Experiments were performed on mixtures of PEO and Laponite at different concentrations. These mixtures can exhibit very strong shear thickening behavior: under shear, the suspension can become a yield stress material sufficiently strong to support its own weight. Depending on the polymer concentration, we observe continuous or discontinuous shear thickening mechanisms; it is the discontinuous shear thickening that leads to the formation of yield stress materials.

Published
2012

2. Pattern formation by dewetting and evaporating sedimenting suspensions

Author

Daniel Bonn, Mehdi Habibi, Abdoulaye Fall, Peder Moller, Salima Rafaï, Laboratoire de Physique Statistique de l'ENS (LPS), Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS), Département Electronique et Physique (TSP - EPH), Institut Mines-Télécom [Paris] (IMT)-Télécom SudParis (TSP), Laboratoire Interdisciplinaire de Physique [Saint Martin d’Hères] (LIPhy), Université Joseph Fourier - Grenoble 1 (UJF)-Centre National de la Recherche Scientifique (CNRS), Soft Matter (WZI, IoP, FNWI), Université Paris Diderot - Paris 7 (UPD7)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)-Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Département Electronique et Physique (EPH), and Fall, Abdoulaye

Subjects
Length scale, Materials science, Evaporation, Pattern formation, 01 natural sciences, [PHYS] Physics [physics], 010305 fluids & plasmas, Viscosity, Optics, 0103 physical sciences, Life Science, Dewetting, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], Thin film, 010306 general physics, ComputingMilieux_MISCELLANEOUS, [PHYS]Physics [physics], business.industry, Contact line, General Chemistry, Condensed Matter Physics, [PHYS.COND.CM-SCM] Physics [physics]/Condensed Matter [cond-mat]/Soft Condensed Matter [cond-mat.soft], Chemical physics, Particle, business, [PHYS.COND.CM-SCM]Physics [physics]/Condensed Matter [cond-mat]/Soft Condensed Matter [cond-mat.soft], [PHYS.COND] Physics [physics]/Condensed Matter [cond-mat]
Abstract

Pattern formation from drying droplets containing sedimenting particles and dewetting of thin films of such suspensions was studied. The dewetting causes the formation of finger-like patterns near the contact line which leave behind a deposit of branches. We find that the strikingly low speed of dewetting is due to the high particle concentration in the contact line region, leading to a strongly enhanced viscosity. For pattern formation from drying droplets (containing particles), evaporation also causes dewetting. In both cases, we find a similar relationship between the size of the patterns and the dewetting speed. The coefficient of this relationship gives us the effective viscosity at the contact line. We present a simple model that accounts for this, and that shows that the size of the particles is the relevant length scale in both problems.

Published
2012
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